Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Davit, Melkonyan"'
Autor:
Davit Melkonyan
Publikováno v:
State and Law. 91:5-13
The article is dedicated to the seizure of property subject to confiscation during the investigation of corruption crimes. Based on an analysis of international documents, such as the FATF Recommendations, the UN Conventions, and the ECHR judgments,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a784478e6238b606725bfdae5faf9a4
https://doi.org/10.46991/sl/2021.91.005
https://doi.org/10.46991/sl/2021.91.005
Autor:
Nicolas Rolland, G. Audoit, Isabelle Mouton, Davit Melkonyan, Wilfried Vandervorst, Janusz Bogdanowicz, Didier Blavette, Jean-Paul Barnes, François Vurpillot, Claudia Fleischmann, Sylvain Barraud, Adeline Grenier, Sébastien Duguay
Publikováno v:
Scripta Materialia
Scripta Materialia, Elsevier, 2018, 148, pp.91-97. ⟨10.1016/j.scriptamat.2017.05.012⟩
Scripta Materialia, 2018, 148, pp.91-97. ⟨10.1016/j.scriptamat.2017.05.012⟩
Scripta Materialia, Elsevier, 2018, 148, pp.91-97. ⟨10.1016/j.scriptamat.2017.05.012⟩
Scripta Materialia, 2018, 148, pp.91-97. ⟨10.1016/j.scriptamat.2017.05.012⟩
International audience; Atom probe tomography is unique in its ability to image in 3D at the atomic scale and measure composition in asemiconductor device with high sensitivity. However it suffers from many artefacts. The current state of the art ofn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f16f96c54684b1fa2f2b63abd69968e2
https://doi.org/10.1016/j.scriptamat.2017.05.012
https://doi.org/10.1016/j.scriptamat.2017.05.012
Autor:
E. Vecchio, Roger Loo, Geert Eneman, W. Li, Nadine Collaert, C. Lorant, Geert Hellings, Davit Melkonyan, Trong Huynh-Bao, Philippe Matagne, Erik Rosseel, Arturo Sibaja-Hernandez, Farid Sebaai, Anabela Veloso, Claudia Fleischmann, Dennis H. van Dorp, Niamh Waldron, Katia Devriendt, Zheng Tao, Dan Mocuta, Bernardette Kunert, Efrain Altamirano-Sanchez, Lieve Teugels, Stephan Brus, Philippe Marien, Alexey Milenin, Vasile Paraschiv, Eddy Simoen, Boon Teik Chan
Publikováno v:
ECS Transactions. 80:3-20
Over the past decades, aggressive and continuous transistor scaling according to Moore’s law has enabled new system features thanks to ever increasing device performance and density, reduced cost and power consumption. To keep the industry’s grow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5e7f3a6b4d2f490c789fb8b77f74a4c5
https://doi.org/10.1149/08002.0003ecst
https://doi.org/10.1149/08002.0003ecst
Autor:
Ramya, Cuduvally, Richard J H, Morris, Piero, Ferrari, Janusz, Bogdanowicz, Claudia, Fleischmann, Davit, Melkonyan, Wilfried, Vandervorst
Publikováno v:
Ultramicroscopy. 210
With the objective of applying laser-assisted atom probe tomography to compositional analysis within nanoscale InGaAs devices, experimental conditions that may provide an accurate composition estimate were sought by extensively studying an InGaAs bla
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::26145f97c39a34de4aa7556fe0b8f3a3
https://pubmed.ncbi.nlm.nih.gov/31918069
https://pubmed.ncbi.nlm.nih.gov/31918069
Autor:
Davit Melkonyan, Paola Favia, Bastien Douhard, Alexis Franquet, Wilfried Vandervorst, Thierry Conard
Publikováno v:
Applied Surface Science. 365:143-152
The continued downscaling of micro and nanoelectronics devices has increased the importance of novel materials and their interfaces very strongly thereby necessitating the availability of adequate metrology and very tight process control as well. For
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8fa75068c10472ab52885afd903efeec
https://doi.org/10.1016/j.apsusc.2016.01.056
https://doi.org/10.1016/j.apsusc.2016.01.056
Autor:
Davit Melkonyan, Luca La Notte, Jeffrey G. Tait, Paul Heremans, Andrea Reale, David Cheyns, Robert Gehlhaar
Publikováno v:
Solar Energy Materials and Solar Cells. 144:493-499
The scaling of thin film photovoltaics to a commercially viable size relies on the series connection of multiple small cells into modules. These interconnections are typically formed by three patterning steps, each of which have an impact on the seri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c96e2b6faec9567fed81ef0f6da6bf99
https://doi.org/10.1016/j.solmat.2015.09.056
https://doi.org/10.1016/j.solmat.2015.09.056
Autor:
Davit Melkonyan, Wilfried Vandervorst, Janusz Bogdanowicz, Piero Ferrari, Claudia Fleischmann, Richard J. H. Morris, Ramya Cuduvally
Publikováno v:
Ultramicroscopy. 210:112918
With the objective of applying laser-assisted atom probe tomography to compositional analysis within nanoscale InGaAs devices, experimental conditions that may provide an accurate composition estimate were sought by extensively studying an InGaAs bla
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8508e77fea48b89ba34ed286aa8979b4
https://doi.org/10.1016/j.ultramic.2019.112918
https://doi.org/10.1016/j.ultramic.2019.112918
Autor:
Ming Zhao, Wilfried Vandervorst, Richard J. H. Morris, Davit Melkonyan, Ramya Cuduvally, Paul van der Heide
Publikováno v:
Ultramicroscopy. 206
Scaling and non-planar architectures are key factors helping to advance the semiconductor field. Accurate 3-dimensional atomic scale information is therefore sought but this presents a significant metrology challenge. Atom probe tomography has emerge
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9c2345ed7fbd30dd65a24b1b976a4d8c
https://pubmed.ncbi.nlm.nih.gov/31351311
https://pubmed.ncbi.nlm.nih.gov/31351311
For the very first time, atomic force microscopy is used to determine quantitatively the 3-dimensional shape of an atom probe tip, which is key towards improved accuracy and understanding of artefacts in atom probe tomography. We have successfully me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1a249c45aa665c627059d994aa1bd6b
https://lirias.kuleuven.be/handle/123456789/651209
https://lirias.kuleuven.be/handle/123456789/651209
Autor:
Claudia Fleischmann, Ramya Cuduvally, Davit Melkonyan, Igor Makhotkin, Jonathan Op de Beeck, Richard V. Morris, Paul van der Heide, Wilfried Vandervorst
Publikováno v:
Microscopy and Microanalysis. 25:312-313
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd72907ae58d023b19d98739d6f66211
https://doi.org/10.1017/s1431927619002290
https://doi.org/10.1017/s1431927619002290