Zobrazeno 1 - 5
of 5
pro vyhledávání: '"David W. Shortt"'
Autor:
Kenneth P. Gross, Gildardo Delgado, David W. Shortt, Matthew Derstine, Richard W. Solarz, Anotoly Shchemelinin, Ilya Bezel
Publikováno v:
CLEO: 2015.
For the last 8 years, the brightness of UV lightsources in KT Broadband inspection tools increased by orders of magnitude due to advances in LSP technology. Challenges of LSP in high-power regime are discussed here.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a042f92588d3c5d38b47fd8dd44beb9e
https://doi.org/10.1364/cleo_at.2015.atu4m.2
https://doi.org/10.1364/cleo_at.2015.atu4m.2
Autor:
Lisa Cheung, David W. Shortt
Publikováno v:
Solid State Phenomena. :133-136
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0323d946ca500f973bba497e0e484349
https://doi.org/10.4028/www.scientific.net/ssp.103-104.133
https://doi.org/10.4028/www.scientific.net/ssp.103-104.133
Autor:
David W. Shortt
Publikováno v:
Journal of Chromatography A. 686:11-20
Molecular radius information obtained with multi-angle laser light scattering combined with gel permeation chromatography was used to obtain an upper limit for the polydispersity −Mw/−Mn of a narrow-distribution polystyrene standard dissolved in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e8ef564aa791460a8a27d67d3a37f69
https://doi.org/10.1016/0021-9673(94)00070-0
https://doi.org/10.1016/0021-9673(94)00070-0
Autor:
David W. Shortt
Publikováno v:
Journal of Liquid Chromatography. 16:3371-3391
The definition and derivation of differential molecular weight distribution functions are thoroughly discussed. Common errors appearing in the literature are revealed and corrected. For high performance size exclusion chromatography (HPSEC), the impo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a09c9b266901007e425afd3573e9b62
https://doi.org/10.1080/10826079308019695
https://doi.org/10.1080/10826079308019695
Autor:
Paul J. Sullivan, Hans J. Hansen, David W. Shortt, Rodney Smedt, Daniel Kavaldjiev, Christopher F. Bevis, George Kren
Publikováno v:
The Journal of the Acoustical Society of America. 128:961
A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d40182f7947be85413cc5500c9c20117
https://doi.org/10.1121/1.3481733
https://doi.org/10.1121/1.3481733