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pro vyhledávání: '"David R. Batchelor"'
Autor:
David R. Batchelor, Edmund Blomley, Erhard Huttel, Michael Hagelstein, Akira Mochihashi, Marcel Schuh, Rolf Simon
Publikováno v:
Journal of Synchrotron Radiation, Vol 31, Iss 3, Pp 590-595 (2024)
To characterize an electron beam, visible synchrotron light is often used and dedicated beamlines at synchrotron sources are becoming a more common feature as instruments and methods for the diagnostics are, along with the accelerators, further devel
Externí odkaz:
https://doaj.org/article/510a16939d584761b8c4f54ff1d05dd9
