Zobrazeno 1 - 2
of 2
pro vyhledávání: '"David R. Albrecht"'
Publikováno v:
2009 IEEE Radiation Effects Data Workshop.
Enhanced single event upset (SEU) sensitivity to low energy protons, as much as 5-6 orders of ten, has been observed in 90 nm epitaxial-bulk complementary metal oxide semiconductor (CMOS) static random access memories (SRAM). Enhancements to process
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::234a260f09db3c28f1f90743c020607c
https://doi.org/10.1109/redw.2009.5336302
https://doi.org/10.1109/redw.2009.5336302
Publikováno v:
Lecture Notes in Computer Science ISBN: 9783540874027
RAID
RAID
Vulnerability signatures offer better precision and flexibility than exploit signatures when detecting network attacks. We show that it is possible to detect vulnerability signatures in high-performance network intrusion detection systems, by develop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::87e7553384513b465087ff2744bbde2d
https://doi.org/10.1007/978-3-540-87403-4_9
https://doi.org/10.1007/978-3-540-87403-4_9
