Zobrazeno 1 - 6
of 6
pro vyhledávání: '"David R. Albrecht"'
Publikováno v:
2009 IEEE Radiation Effects Data Workshop.
Enhanced single event upset (SEU) sensitivity to low energy protons, as much as 5-6 orders of ten, has been observed in 90 nm epitaxial-bulk complementary metal oxide semiconductor (CMOS) static random access memories (SRAM). Enhancements to process
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::234a260f09db3c28f1f90743c020607c
https://doi.org/10.1109/redw.2009.5336302
https://doi.org/10.1109/redw.2009.5336302
Publikováno v:
Lecture Notes in Computer Science ISBN: 9783540874027
RAID
RAID
Vulnerability signatures offer better precision and flexibility than exploit signatures when detecting network attacks. We show that it is possible to detect vulnerability signatures in high-performance network intrusion detection systems, by develop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::87e7553384513b465087ff2744bbde2d
https://doi.org/10.1007/978-3-540-87403-4_9
https://doi.org/10.1007/978-3-540-87403-4_9
Autor:
Albrecht, D.R., II
Publikováno v:
Proceedings of the Fourteenth Biennial University/Government/Industry Microelectronics Symposium (Cat. No.01CH37197); 2001, p149-152, 4p
Publikováno v:
Recent Advances in Intrusion Detection (9783540874027); 2008, p1-1, 1p
On behalf of the Program Committee, it is our pleasure to present the p- ceedings of the 11th International Symposium on Recent Advances in Intrusion Detection (RAID 2008), which took place in Cambridge, Massachusetts, USA on September 15–17. The s