Zobrazeno 1 - 1
of 1
pro vyhledávání: '"David P. Sisler"'
Publikováno v:
Optical Interference Coatings.
A sensitive interferometric method is employed to quantify the deformation of silicon substrates coated with thin plasma-polymerized acrylonitrile film deposited at room temperature. This provides insight into the structural variation of plasma polym
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb52554c132ef2aa8e0c3a2c0eb34aff
https://doi.org/10.1364/oic.2010.wb7
https://doi.org/10.1364/oic.2010.wb7
