Zobrazeno 1 - 10
of 71
pro vyhledávání: '"David P. Haefner"'
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 11, Pp 376-384 (2023)
The Photon Counting Histogram Expectation Maximization (PCH-EM) algorithm has recently been reported as a candidate method for the characterization of Deep Sub-Electron Read Noise (DSERN) image sensors. This work describes a comprehensive demonstrati
Externí odkaz:
https://doaj.org/article/82800d04c21144c5a74b74dd4641771f
Autor:
Aaron J. Hendrickson, David P. Haefner
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 11, Pp 367-375 (2023)
We develop a novel algorithm for characterizing Deep Sub-Electron Read Noise (DSERN) image sensors. This algorithm is able to simultaneously compute maximum likelihood estimates of quanta exposure, conversion gain, bias, and read noise of DSERN pixel
Externí odkaz:
https://doaj.org/article/d956bbf813084c448235d16cc22654b3
Publikováno v:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIII.
Publikováno v:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIII.
Autor:
Bradley L, Preece, David P, Haefner
Publikováno v:
Applied Optics. 61:6202
A photon transfer curve (PTC) is used to determine fundamental detector noise parameters such as read noise, conversion gain, and fixed pattern noise. Here, the method for determining a PTC is expanded to include 3D noise parameters. 3D noise PTC pro
Publikováno v:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXII.
Time and resource constraints often limit the number of cameras available to establish statistical confidence in determining if a device meets a desired range performance requirement. For thermal cameras, measurements of sampling/resolution, sensitiv
Autor:
Gerald C. Holst, David P. Haefner
Publikováno v:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI.
Publikováno v:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX.
Autor:
David P. Haefner
Publikováno v:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX.
Publikováno v:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX.
Typical thermal system performance measurements include measurements from a sensor’s digital or analog output while system performance characterizations are based upon measurements from those outputs while characterizing the performance of the disp