Zobrazeno 1 - 4
of 4
pro vyhledávání: '"David Nackashi"'
Publikováno v:
Microscopy Today. 30:22-25
The interaction of the electron beam with materials during TEM/STEM imaging often leads to radiation damage. While a variety of low-dose techniques can help mitigate beam damage, true dose management starts with knowing the precise total accumulated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f6e3dbe8dc49acc2c089f5b1d20d144
https://doi.org/10.1017/s1551929522000840
https://doi.org/10.1017/s1551929522000840
Autor:
Madeline Dressel Dukes, Kate Marusak, Yaofeng Guo, Jennifer McConnell, Stamp Walden, John Damiano, David Nackashi
Publikováno v:
Microscopy and Microanalysis. 28:108-109
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa93a97632433497388abcbf3cf17bc7
https://doi.org/10.1017/s1431927622001337
https://doi.org/10.1017/s1431927622001337
Autor:
Stamp Walden, Madeline Dressel Dukes, Kate Marusak, Yaofeng Guo, Jennifer McConnell, John Damiano, David Nackashi
Publikováno v:
Microscopy and Microanalysis. 28:2142-2143
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8553ea9b4117857b26ea3b3dcf8bf341
https://doi.org/10.1017/s1431927622008297
https://doi.org/10.1017/s1431927622008297
Publikováno v:
Chemistry of Materials; Oct2010, Vol. 22 Issue 20, p5695-5699, 5p