Zobrazeno 1 - 10
of 29
pro vyhledávání: '"David Nackashi"'
Publikováno v:
Microscopy Today. 30:22-25
The interaction of the electron beam with materials during TEM/STEM imaging often leads to radiation damage. While a variety of low-dose techniques can help mitigate beam damage, true dose management starts with knowing the precise total accumulated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f6e3dbe8dc49acc2c089f5b1d20d144
https://doi.org/10.1017/s1551929522000840
https://doi.org/10.1017/s1551929522000840
Autor:
Madeline Dressel Dukes, Kate Marusak, Yaofeng Guo, Jennifer McConnell, Stamp Walden, John Damiano, David Nackashi
Publikováno v:
Microscopy and Microanalysis. 28:108-109
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa93a97632433497388abcbf3cf17bc7
https://doi.org/10.1017/s1431927622001337
https://doi.org/10.1017/s1431927622001337
Autor:
Stamp Walden, Madeline Dressel Dukes, Kate Marusak, Yaofeng Guo, Jennifer McConnell, John Damiano, David Nackashi
Publikováno v:
Microscopy and Microanalysis. 28:2142-2143
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8553ea9b4117857b26ea3b3dcf8bf341
https://doi.org/10.1017/s1431927622008297
https://doi.org/10.1017/s1431927622008297
Publikováno v:
Chemistry of Materials; Oct2010, Vol. 22 Issue 20, p5695-5699, 5p
Autor:
Lyman, Charles (AUTHOR)
Publikováno v:
Microscopy Today. Sep2023, Vol. 31 Issue 5, p12-16. 5p.
Autor:
Damiano, John1 (AUTHOR) john@protochips.com, Walden, Stamp1 (AUTHOR), Franks, Alan1 (AUTHOR), Marusak, Kate1 (AUTHOR), Larson, Ben1 (AUTHOR), Coy, Mike1 (AUTHOR), Nackashi, David1 (AUTHOR)
Publikováno v:
Microscopy Today. Jul2022, Vol. 30 Issue 4, p22-25. 4p.
Autor:
Walden, Stamp, Dukes, Madeline Dressel, Marusak, Kate, Guo, Yaofeng, McConnell, Jennifer, Damiano, John, Nackashi, David
Publikováno v:
Microscopy & Microanalysis; 2022 Supplement, Vol. 28, p2142-2143, 2p
Autor:
Dukes, Madeline Dressel, Marusak, Kate, Guo, Yaofeng, McConnell, Jennifer, Walden, Stamp, Damiano, John, Nackashi, David
Publikováno v:
Microscopy & Microanalysis; 2022 Supplement, Vol. 28, p108-109, 2p
Publikováno v:
Microscopy Today. Sep2019, Vol. 27 Issue 5, p36-40. 5p.
Publikováno v:
Microscopy Today. Sep2013, Vol. 21 Issue 5, p40-45. 6p.