Zobrazeno 1 - 10
of 16
pro vyhledávání: '"David Lee Windt"'
Autor:
Ralf K. Heilmann, David Lee Windt, Sarah N. Heine, Herman Marshall, Alan Garner, Brian Ramsey, Norbert S. Schulz
Publikováno v:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17c3ed8dd7fbfd21039d505e400d68e7
https://doi.org/10.1117/12.2529546
https://doi.org/10.1117/12.2529546
Autor:
Gianpiero Tagliaferri, Sarah N. T. Heine, Deepto Chakrabarty, Brian Ramsey, Mark Egan, Norbert S. Schulz, Svetlana G. Jorstad, Tim Hellickson, Giovanni Pareschi, Martin C. Weisskopf, Eric M. Gullikson, David Lee Windt, Mark L. Schattenburg, Herman L. Marshall, Ralf K. Heilmann, Alan P. Marscher, H. Moritz Günther
The Rocket Experiment Demonstration of a Soft X-ray Polarimeter (REDSoX Polarimeter) is a sounding rocket instrument that can make the first measurement of the linear X-ray polarization of an extragalactic source in the 0.2-0.8 keV band as low as 10%
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2ce12c28321bda10afecbbbe749138da
http://hdl.handle.net/20.500.12386/30615
http://hdl.handle.net/20.500.12386/30615
Autor:
David Lee Windt
Publikováno v:
The Astrophysical Journal. 564:L61-L64
Extinction due to large-diameter intergalactic gray (i.e., nonreddening) dust grains has been identified as a possible mechanism to explain the apparent systematic dimming of high-redshift Type Ia supernovae, an alternative hypothesis to the interpre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa371b3f53eb4df0563fd4cb8cf88033
https://doi.org/10.1086/339019
https://doi.org/10.1086/339019
Publikováno v:
The Astrophysical Journal. 528:306-309
We have calculated on a small angular scale the distribution of X-rays (e.g., as originating from a point source) scattered by interstellar dust. In addition to the well-known, large-diameter (i.e., hundreds of arcseconds) X-ray halo due to dust dist
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3fcfa0c9fbf29edf4ea33087c56a876
https://doi.org/10.1086/308145
https://doi.org/10.1086/308145
Autor:
Suzanne Romaine, A. M. Parsons, Melville P. Ulmer, Oberto Citterio, Fiona A. Harrison, Jonathan E. Grindlay, William W. Craig, Walter R. Cook, Giovanni Pareschi, Brian D. Ramsey, Jack Tueller, Neil Gehrels, David Lee Windt, Charles J. Hailey, Hideyo Kunieda, Richard A. Kroeger, Martin C. Weisskopf, Robert Petre, Paul Gorenstein, Finn Erland Christensen
Publikováno v:
SPIE Proceedings.
In addition to high resolving power in the traditional x-ray band, the Constellation X-ray scientific goals require broad bandpass, with response extending to E >= 40 keV. To achieve this objective, Constellation-X will incorporate a hard x-ray teles
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b24debbd43cb5a98417737860c233fc
https://doi.org/10.1117/12.366492
https://doi.org/10.1117/12.366492
Autor:
Peter H. Mao, Charles J. Hailey, A. Souvorov, T. Decker, Giovanni Pareschi, Ahsen M. Hussain, Anders Ø. Madsen, David Lee Windt, Rémi Tucoulou, Mario A. Jimenez-Garate, Christian B. Mammen, William W. Craig, Finn Erland Christensen, Manuel Sanchez del Rio, Andreas K. Freund, Fiona A. Harrison, Marcela Stern
Publikováno v:
SPIE Proceedings.
We have performed x-ray specular reflectivity and scattering measurements of thermally slumped glass substrates on x-ray diffractometers utilizing a rotating anode x-ray source at the Danish Space Research Institute (DSRI) and synchrotron radiation a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::719d557ec916f643a81528b6eaf2daa8
https://doi.org/10.1117/12.363635
https://doi.org/10.1117/12.363635
Autor:
David Lee Windt
Publikováno v:
SPIE Proceedings.
High reflectance multilayer films can now be deposited onto figured substrate to make focusing X-ray mirrors. In this paper, I discuss a variety of topics associated with the development and further refinement of such X-ray optics: high- efficiency m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a9610b6bd4d6b4557f745189d26464d0
https://doi.org/10.1117/12.332515
https://doi.org/10.1117/12.332515
Autor:
Pat G. Watson, Raymond A. Cirelli, G. R. Weber, Omkaram Nalamasu, Lee Edward Trimble, Masis Mkrtchyan, David Lee Windt
Publikováno v:
SPIE Proceedings.
We report on a novel technique for tuning the illumination of a lithography tool through the use of variable transmission apertures. In conjunction with this illumination technique, we have developed simulation software capable of identifying the opt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8edd570e1ebedd5a3608e25b25c20f6f
https://doi.org/10.1117/12.310739
https://doi.org/10.1117/12.310739
Autor:
Milton L. Peabody, David Lee Windt, B. Boyer, James Alexander Liddle, Larry C. Davis, Richard J. Kasica, Steve L. Hentschel, Larry S. Zurbrick, James N. Wiley, Anthony E. Novembre, Christopher M. Aquino, Reginald C. Farrow, Thomas E. Saunders, Myrtle I. Blakey, Masis Mkrtchyan
Publikováno v:
SPIE Proceedings.
The purpose of the study reported here was to determine the range of material parameters and optical conditions necessary for using light to identify and categorize defects and to measure linewidths in SCALPEL masks. A prototype 4X SCALPEL mask with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d402b7210c9d04e5f38f69a06f91c7dd
https://doi.org/10.1117/12.308730
https://doi.org/10.1117/12.308730
Autor:
W. F. Connelly, James Alexander Liddle, Warren K. Waskiewicz, Anthony E. Novembre, Harry H. Wade, Chester S. Knurek, L. Rutberg, R. DeMarco, C. Biddick, J. P. Custy, A. H. Crorken, J. S. Kraus, Joseph A. Felker, Pat G. Watson, K. S. Werder, H. A. Huggins, Stephen W. Bowler, Lloyd R. Harriott, Milton L. Peabody, Richard J. Kasica, R. R. Freeman, K. Brady, Steven D. Berger, Regine G. Tarascon-Auriol, Myrtle I. Blakey, Masis Mkrtchyan, L. Fetter, Reginald C. Farrow, R. M. Camarda, David Lee Windt, L. C. Hopkins
Publikováno v:
SPIE Proceedings.
We have designed, constructed, and are now performing experiments with a proof-of-concept projection electron-beam lithography system based upon the SCALPELR (scattering with angular limitation projection electron-beam lithography) principle. This in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3d93d805409ef28706da473d83f37ee
https://doi.org/10.1117/12.275786
https://doi.org/10.1117/12.275786