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Publikováno v:
IEEE Transactions on Electron Devices. 69:6102-6105
Autor:
Albert Chen, Ilya V. Karpov, Yifu Huang, Oleg Golonzka, Chris Connor, Nathan L. Strutt, Jiahan Zhang, Benjamin Sherrill, Tanmoy Pramanik, Jacob Medeiros, David Janosky, Jack C. Lee, Tony Acosta, Reed Hopkins, Abdullah Guler, Pedro A. Quintero, J. Hicks, Yao-Feng Chang, J. O'Donnell
Publikováno v:
IRPS
For the first time, the impact of temperature instability of resistive memory switching on potential neuromorphic computing applications has been extensively studied using eNVM-R and eNVM-M technologies developed on Intel 22FFL process. The reliabili