Deagglomeration of DNA nanomedicine carriers using controlled ultrasonication

Autor: Beth A. Hinchliffe, Piers Turner, David J. H. Cant, Emiliana De Santis, Purnank Aggarwal, Rob Harris, David Templeton, Alex G. Shard, Mark Hodnett, Caterina Minelli

Publikováno v: Ultrasonics Sonochemistry, Vol 89, Iss , Pp 106141- (2022)

Control over the agglomeration state of manufactured particle systems for drug and oligonucleotide intracellular delivery is paramount to ensure reproducible and scalable therapeutic efficacy. Ultrasonication is a well-established mechanism for the d

Externí odkaz: https://doaj.org/article/feb3dcf8a7e94f63b09eea42f743ec28

Quantification of hard X‐ray photoelectron spectroscopy: Calculating relative sensitivity factors for 1.5‐ to 10‐keV photons in any instrument geometry

Autor: David J. H. Cant, Ben F. Spencer, Wendy R. Flavell, Alexander G. Shard

Publikováno v: Cant, D J H, Spencer, B F, Flavell, W R & Shard, A G 2022, ' Quantification of hard X-ray photoelectron spectroscopy: Calculating relative sensitivity factors for 1.5- to 10-keV photons in any instrument geometry ', Surface and Interface Analysis . https://doi.org/10.1002/sia.7059

A method for the rapid determination of theoretical relative sensitivity factors (RSFs) for hard X-ray photoelectron spectroscopy (HAXPES) instruments of any type and photon energy has been developed. We develop empirical functions to describe discre

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::69611582d6c1dde14e553e2382ec8b7d
https://doi.org/10.1002/sia.7059

Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles

Autor: Mark Stewart, Ken Mingard, David J. H. Cant, Alexander G. Shard, Caterina Minelli, Yiwen Pei, Rasmus Havelund, Martin P. Seah

Publikováno v: The Journal of Physical Chemistry C. 124:23752-23763

The ability to measure the internal chemical distribution of particles is of significant benefit to the development and testing of products relevant to the pharmaceutical, agrichemical, and food in...

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::de11588e30a5572d4e6042158632f430
https://doi.org/10.1021/acs.jpcc.0c07445

Integrated molecular dynamics and experimental approach to characterize low-free-energy perfluoro-decyl-acrylate (PFDA) coated silicon

Autor: David J. H. Cant, Francesco Maria Bellussi, Pietro Asinari, Claude Becker, Lorenzo Chiavarini, Edoardo Rossi, Marco Sebastiani, Annalisa Cardellini

Publikováno v: Materials & Design, Vol 208, Iss, Pp 109902-(2021)
Materials & Design

Low-free-energy surfaces have attracted an intense academic and industrial interest over the last decade. A reduction of the surface free energy (SFE) has been found to enhance self-cleaning, hydrophobic, and non-fouling properties of surfaces, which

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f8e1d226d762330ae929a27e6cef25b9
http://www.sciencedirect.com/science/article/pii/S026412752100455X

Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers:A comparison of synchrotron and lab-based (9.25 keV) measurements

Autor: Sven Tougaard, B.P. Reed, David J. H. Cant, Ben F. Spencer, Andrew G. Thomas, S.K. Eriksson, Alexander G. Shard, S. Maniyarasu, Wendy R. Flavell, Christopher A. Muryn, M. Maschek, T. Wiell, Ruben Ahumada-Lazo, Tien-Lin Lee

Publikováno v: Spencer, B F, Maniyarasu, S, Reed, B P, Cant, D J H, Ahumada-Lazo, R, Thomas, A G, Muryn, C A, Maschek, M, Eriksson, S K, Wiell, T, Lee, T L, Tougaard, S, Shard, A G & Flavell, W R 2021, ' Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers : A comparison of synchrotron and lab-based (9.25 keV) measurements ', Applied Surface Science, vol. 541, 148635 . https://doi.org/10.1016/j.apsusc.2020.148635
Spencer, B, Maniyarasu, S, Reed, B, Cant, D J H, Ahumada Lazo, R, Thomas, A, Muryn, C, Maschek, M, Eriksson, S K, Wiell, T, Lee, T L, Tougaard, S, Shard, G & Flavell, W 2021, ' Inelastic background modelling applied to Hard X-ray Photoelectron Spectroscopy of deeply buried layers: a comparison of synchrotron and lab-based (9.25 keV) measurements ', Applied Surface Science, vol. 541, 148635 . https://doi.org/10.1016/j.apsusc.2020.148635

Hard X-ray Photoelectron Spectroscopy (HAXPES) provides minimally destructive depth profiling into the bulk, extending the photoelectron sampling depth. Detection of deeply buried layers beyond the elastic limit is enabled through inelastic backgroun

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd35901ed344af9121ec639c8f28f10f
https://findresearcher.sdu.dk:8443/ws/files/175916022/1_s2.0_S0169433220333936_main.pdf