Zobrazeno 1 - 10
of 140
pro vyhledávání: '"David J. Frank"'
Autor:
Devin Underwood, Joseph A. Glick, Ken Inoue, David J. Frank, John Timmerwilke, Emily Pritchett, Sudipto Chakraborty, Kevin Tien, Mark Yeck, John F. Bulzacchelli, Chris Baks, Raphael Robertazzi, Matthew Beck, Rajiv V. Joshi, Dorothy Wisnieff, Scott Lekuch, Brian P. Gaucher, Daniel J. Friedman, Pat Rosno, Daniel Ramirez, Jeff Ruedinger
Publikováno v:
PRX Quantum, Vol 5, Iss 1, p 010326 (2024)
Qubit control electronics composed of CMOS circuits are of critical interest for next-generation quantum computing systems. A CMOS-based application-specific integrated circuit (ASIC) fabricated in 14-nm fin field-effect transistor (FinFET) technolog
Externí odkaz:
https://doaj.org/article/b4874854c72746b1b718911c6c5a6faa
Autor:
Sudipto Chakraborty, David J. Frank, Kevin Tien, Pat Rosno, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Devin Underwood, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Shawn D. Chambers, Scott Lekuch, Ken Inoue, Dorothy Wisnieff, Christian W. Baks, Donald S. Bethune, John Timmerwilke, Thomas Fox, Peilin Song, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman
Publikováno v:
IEEE Journal of Solid-State Circuits. 57:3258-3273
Autor:
David J. Frank, Sudipto Chakraborty, Kevin Tien, Pat Rosno, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Scott Lekuch, Ken Inoue, Devin Underwood, Dorothy Wisnieff, Chris Baks, John Timmerwilke, Peilin Song, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman
Publikováno v:
2023 IEEE Custom Integrated Circuits Conference (CICC).
Previous research has shown that emotionally-valenced words are given higher judgements of learning (JOLs) than are neutral words. The current study examined potential explanations for this emotional salience effect on JOLs. Experiment 1 replicated t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f38f724b103f0cf3c6c76d72f5290ccb
Autor:
Andrew M. Tague, David J Frank
Fiction is often a reflection of different aspects of life and as such offer a unique opportunity to both educators and academics to explore topics and provide examples that are accessible. A popular debate among educators and academics is nature vs.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80c2d17db1737c3c65da003657502bf7
https://doi.org/10.31235/osf.io/jxy49
https://doi.org/10.31235/osf.io/jxy49
Publikováno v:
Zeitschrift für Psychologie. 228:296-300
Abstract. Past research found robust metamemory illusions about the effects of font type, word-pair identity, volume, and font size on memory that are assumed to share a common cause, such as fluency. The current study simultaneously assessed all fou
Autor:
Kevin Tien, Ken Inoue, Scott Lekuch, David J. Frank, Sudipto Chakraborty, Pat Rosno, Thomas Fox, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Devin Underwood, Dorothy Wisnieff, Chris Baks, Donald Bethune, John Timmerwilke, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman
Publikováno v:
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Autor:
David J. Frank, Sudipto Chakraborty, Kevin Tien, Pat Rosno, Thomas Fox, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Shawn D. Chambers, Scott Lekuch, Ken Inoue, Devin Underwood, Dorothy Wisnieff, Chris Baks, Donald Bethune, John Timmerwilke, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman
Publikováno v:
2022 IEEE International Solid- State Circuits Conference (ISSCC).
Autor:
Amit Ranjan Trivedi, David J. Frank, Takashi Ando, Madhu Padmanabha Sumangala, Ahish Shylendra
Publikováno v:
IEEE Electron Device Letters. 41:1396-1399
In this work, we discuss the mitigation of threshold voltage ( ${V}_{{TH}}$ ) variability in nanoscale FinFET by exploiting the interaction of oxygen vacancies (OV) against metal gate granularity (MGG). Deposition of a metal gate on high- $\kappa $ d
Autor:
David J Frank, Brooke N. Macnamara
Publikováno v:
Psychological Research.
Why are some tasks more difficult to learn than others? Hoffman et al. (Accelerated expertise: training for high proficiency in a complex world. Psychology Press, New York, 2014) hypothesized that certain task characteristics-termed "dimensions of di