Zobrazeno 1 - 10
of 551
pro vyhledávání: '"David J. Frank"'
Autor:
Andrés Bernasconi
Publikováno v:
Estudios Públicos. :207-212
Reseña de libro The University and the Global Knowledge Society de David J. Frank y John W. Meyer
Publikováno v:
Landscape Management. Mar2019, Vol. 58 Issue 3, p11-11. 1/4p.
Autor:
Harwood, Jonathan
Publikováno v:
The British Journal for the History of Science, 2008 Mar 01. 41(1), 147-148.
Externí odkaz:
https://www.jstor.org/stable/30160884
Autor:
Devin Underwood, Joseph A. Glick, Ken Inoue, David J. Frank, John Timmerwilke, Emily Pritchett, Sudipto Chakraborty, Kevin Tien, Mark Yeck, John F. Bulzacchelli, Chris Baks, Raphael Robertazzi, Matthew Beck, Rajiv V. Joshi, Dorothy Wisnieff, Scott Lekuch, Brian P. Gaucher, Daniel J. Friedman, Pat Rosno, Daniel Ramirez, Jeff Ruedinger
Publikováno v:
PRX Quantum, Vol 5, Iss 1, p 010326 (2024)
Qubit control electronics composed of CMOS circuits are of critical interest for next-generation quantum computing systems. A CMOS-based application-specific integrated circuit (ASIC) fabricated in 14-nm fin field-effect transistor (FinFET) technolog
Externí odkaz:
https://doaj.org/article/b4874854c72746b1b718911c6c5a6faa
Autor:
DIFRANCO, ROB
Publikováno v:
Landscape Management. Oct2022, Vol. 61 Issue 10, p125-125. 1p.
Autor:
HOLLISTER, SCOTT
Publikováno v:
Landscape Management. Jun2024, Vol. 63 Issue 6, p42-43. 2p.
Autor:
Jonathan Harwood
Publikováno v:
The British Journal for the History of Science. 41:147-148
Autor:
FREEZE, MICHAEL
Publikováno v:
Snow Business; Sep2019, Vol. 20 Issue 5, p6-9, 4p
Publikováno v:
Landscape Management. Apr2019, Vol. 58 Issue 4, p13-13. 1/3p.
Autor:
Sudipto Chakraborty, David J. Frank, Kevin Tien, Pat Rosno, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Devin Underwood, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Shawn D. Chambers, Scott Lekuch, Ken Inoue, Dorothy Wisnieff, Christian W. Baks, Donald S. Bethune, John Timmerwilke, Thomas Fox, Peilin Song, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman
Publikováno v:
IEEE Journal of Solid-State Circuits. 57:3258-3273