Membrane-Based Scanning Force Microscopy

Autor: Marc-Dominik Krass, Martin Héritier, Alexander Eichler, Romana Schirhagl, Thomas Gisler, Letizia Catalini, Albert Schliesser, Eric C. Langman, Urs Grob, Hinrich Mattiat, David Hälg, Christian L. Degen, Ann-Katrin Thamm, Yeghishe Tsaturyan

Publikováno v: Physical Review Applied
Halg, D, Gisler, T, Tsaturyan, Y, Catalini, L, Grob, U, Krass, M-D, Heritier, M, Mattiat, H, Thamm, A-K, Schirhagl, R, Langman, E C, Schliesser, A, Degen, C L & Eichler, A 2021, ' Membrane-Based Scanning Force Microscopy ', Physical Review Applied, vol. 15, no. 2, 021001 . https://doi.org/10.1103/PhysRevApplied.15.L021001
Physical Review Applied, 15 (2)
Physical Review Applied, 15(2):L021001. AMER PHYSICAL SOC

We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry—in our instrument, the substrate

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98042a64d18469f34d03f411cb27d3a2
https://doi.org/10.1103/PhysRevApplied.15.L021001

Strong parametric coupling between two ultra-coherent membrane modes

Autor: 'David Hälg

Publikováno v: Thomas Gisler

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=r3c4b2081b22::b8fa28fa1bb69a88c8bad84cdbab7733