Zobrazeno 1 - 3
of 3
pro vyhledávání: '"David F. M. Mota"'
Publikováno v:
IEEE Transactions on Computers. 70:2001-2012
The radiation sensitivity of memory cells increases dramatically as CMOS manufacture technology scales down; therefore, the reliability of memories has become a challenge. 3D technology has gained attention for having several advantages compared to t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92bd7bda5bff04aaa9aa05d4ce805a97
https://doi.org/10.1109/tc.2020.3034400
https://doi.org/10.1109/tc.2020.3034400
Autor:
David C. C. Freitas, Joao C. M. Mota, Roger Goerl, David F. M. Mota, Fabian Vargas, Cesar Marcon, Jarbas Silveira
Publikováno v:
Integration. 74:71-80
The radiation sensitivity of integrated memory cells increases dramatically as the supply voltage decreases. Although there are some Error Correcting Code (ECC) studies to prevent faults on memories used in space applications, there is no consensus o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9bce4d548762a8be07c738259fe676ae
https://doi.org/10.1016/j.vlsi.2020.04.006
https://doi.org/10.1016/j.vlsi.2020.04.006
Autor:
Jarbas Silveira, Roger Goerl, D Simoes, Joao C. M. Mota, Cesar Marcon, C. Lopes, David F. M. Mota, David C. C. Freitas
Publikováno v:
ISQED
As the supply voltage decreases, the sensitivity of the integrated circuits to radiation increases dramatically, affecting various components such as memory cells. This paper presents, implements, and discusses seven Error Correction Code (ECC) confi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b81bfc2cfe9018eb8945d93946100647
https://doi.org/10.1109/isqed48828.2020.9137019
https://doi.org/10.1109/isqed48828.2020.9137019