Zobrazeno 1 - 10
of 17
pro vyhledávání: '"David F. Barbe"'
Autor:
James Green, David F. Barbe
As universities recognize that an entrepreneurial education is an enabler, entrepreneurship is increasingly recognized as higher education's ally. Today, more than 5,000 entrepreneurship courses are offered in over 2,000 college and universities in t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::178338e1abc7bf7bc5659bb346c0f296
https://doi.org/10.4018/978-1-4666-8468-3.ch061
https://doi.org/10.4018/978-1-4666-8468-3.ch061
Publikováno v:
Journal of Electronic Packaging. 126:37-40
Most connectors are made from copper or copper alloys, with beryllium copper and phosphor bronze being the most common base materials due to their high electrical conductivity, low stress relaxation, and competitive cost. The most significant drawbac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb8ae81987539aa30d543442ccc2e2d3
https://doi.org/10.1115/1.1646425
https://doi.org/10.1115/1.1646425
Autor:
Craig W. Dye, David F. Barbe
This chapter will examine the challenges and opportunities confronted in the commercialization of research-based technologies in a university setting. Particular focus will be brought to the identification and creation of a university-based entrepren
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6b275c5ca69cbc1b81039beeeaac6888
https://doi.org/10.4018/978-1-4666-8487-4.ch006
https://doi.org/10.4018/978-1-4666-8487-4.ch006
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 15:253-259
Increasing resistance and RC time delay induced by an oxidation in a copper line during its lifetime may limit copper-based metallization for technologies with critical dimension. Based on the mechanisms of resistance, constriction resistance and mat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b8645822945909fe088259acc1af719
https://doi.org/10.1109/66.999601
https://doi.org/10.1109/66.999601
Publikováno v:
Quality and Reliability Engineering International. 16:255-260
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c323c9a3996c0366152051f45bf099c5
https://doi.org/10.1002/1099-1638(200007/08)16:4<255::aid-qre331>3.0.co
https://doi.org/10.1002/1099-1638(200007/08)16:4<255::aid-qre331>3.0.co
Autor:
James V. Green, David F. Barbe
As universities recognize that an entrepreneurial education is an enabler, entrepreneurship is increasingly recognized as higher education’s ally. Today, more than 5,000 entrepreneurship courses are offered in over 2,000 college and universities in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d195c4fbd48f68354e52edaff2bc2aa1
https://doi.org/10.4018/978-1-4666-2116-9.ch004
https://doi.org/10.4018/978-1-4666-2116-9.ch004
Publikováno v:
SPIE Proceedings.
Analog methods to deal with the nonuniformity correction problem for infrared focal plane arrays have been addressed. On-chip neural-network based techniques and simulation results of these schemes are presented. The approach is based on one in which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f3ff2d6be73067ab00f99f9558df3ac6
https://doi.org/10.1117/12.210554
https://doi.org/10.1117/12.210554
Publikováno v:
Physical review. B, Condensed matter. 50(7)
We present an approach for modeling nonequilibrium steady-state transport in quantum dots with interacting electrons, which employs real-time many-body Green's functions on a tight-binding basis and accounts for dot-lead coupling exactly. This real-t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ca876fc59ae235d2f984df57648f9572
https://pubmed.ncbi.nlm.nih.gov/9976751
https://pubmed.ncbi.nlm.nih.gov/9976751
Autor:
David F. Barbe
Publikováno v:
Very Large Scale Integration (VLSI) ISBN: 9783642886423
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6020f0d2245ed3c0b8e9421959b8dce
https://doi.org/10.1007/978-3-642-88640-9_10
https://doi.org/10.1007/978-3-642-88640-9_10
Autor:
David F. Barbe
Publikováno v:
Topics in Applied Physics ISBN: 9783540098324
Charge-Coupled Devices
Charge-Coupled Devices
CID image sensing.- Intrinsic focal plane arrays.- Extrinsic silicon focal plane arrays.- Signal processing with charge-coupled devices.- Radiation effects in silicon charge-coupled devices.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f5f23eb441c0a8f12665c31f81ad680
https://doi.org/10.1007/3-540-09832-1
https://doi.org/10.1007/3-540-09832-1