Zobrazeno 1 - 10
of 325
pro vyhledávání: '"David E. Aspnes"'
Publikováno v:
Entropy, Vol 24, Iss 9, p 1238 (2022)
For over five decades, the mathematical procedure termed “maximum entropy” (M-E) has been used to deconvolve structure in spectra, optical and otherwise, although quantitative measures of performance remain unknown. Here, we examine this procedur
Externí odkaz:
https://doaj.org/article/d9cfd8e370fe4f0284e312f58d518ee0
Publikováno v:
Journal of the Korean Physical Society. 81:403-408
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a6ff4c36d6b543b566343b3a726c71c
https://doi.org/10.1007/s40042-022-00554-3
https://doi.org/10.1007/s40042-022-00554-3
Publikováno v:
physica status solidi (b). 260
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::906fdea92ad82b8a60b62af94643e9fa
https://doi.org/10.1002/pssb.202200271
https://doi.org/10.1002/pssb.202200271
Publikováno v:
Journal of the Korean Physical Society. 77:819-823
We present a method of reducing noise in spectra that is based on eliminating low-order derivatives of reciprocal-space (RS) filter functions, yet ensuring that the functions roll off smoothly to minimize Gibbs oscillations. The approach takes advant
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d8ee636e17bb5cfa04a8c7a7d283e89
https://doi.org/10.3938/jkps.77.819
https://doi.org/10.3938/jkps.77.819
Publikováno v:
Current Applied Physics. 20:232-236
We present a systematic method of removing endpoint-discontinuity artifacts in the Fourier analysis of spectral segments, enabling the more accurate extraction of information. This principal-component-removal approach differs from a previous version
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d6a4ba4f287a900ac41d2eb55dc2360d
https://doi.org/10.1016/j.cap.2019.11.004
https://doi.org/10.1016/j.cap.2019.11.004
Autor:
David E. Aspnes, Jin Dong Song, Hoang Tung Nguyen, Han Gyeol Park, Xuan Au Nguyen, Young Dong Kim, Jun Seok Byun, Van Long Le, Tae Jung Kim
Publikováno v:
Journal of the Korean Physical Society. 74:595-599
We report the pseudodielectric functions and the critical points of GaAsxSb1−x ternary alloy films. Data were obtained by performing spectroscopic ellipsometry on 1-μm-thick films grown on (001) GaAs by using molecular beam epitaxy. Artifacts from
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::59ad778f101bfda161aa55ef7f05c4bf
https://doi.org/10.3938/jkps.74.595
https://doi.org/10.3938/jkps.74.595
Publikováno v:
The journal of physical chemistry. A. 124(44)
A classical correlation model (CCM), based on forces instead of potentials, is developed and applied to resonance Raman scattering to provide a foundation for further advances in understanding the effects of fields and vibronic perturbations on the o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a863f1c95b0a2ab19a162c4da585a419
https://pubmed.ncbi.nlm.nih.gov/33084330
https://pubmed.ncbi.nlm.nih.gov/33084330
Linear noise-reduction filters used in spectroscopy must strike a balance between reducing noise and preserving lineshapes, the two conflicting requirements of interest. Here, we quantify this tradeoff by capitalizing on Parseval’s Theorem to cast
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::484fbe89d41fbfe123313d55f770e0a9
Publikováno v:
Journal of Applied Physics. 129:224902
In spectroscopy, the objective is to obtain information by analyzing spectra that ideally are undistorted and noise-free. In standard Fourier-space filtering, this goal cannot be achieved because of apodization, which forces a trade-off among errors
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5bda68b6b449f95ef5b1fc39cebaff61
https://doi.org/10.1063/5.0051602
https://doi.org/10.1063/5.0051602
Autor:
David E. Aspnes
Publikováno v:
Thin Solid Films. 571:334-344
Since its initial development in the early 1970s, spectroscopic ellipsometry (SE) has evolved to become the primary technique for determining the intrinsic and structural properties of homogeneous and inhomogeneous materials in bulk and thin-film for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57ada8631a6a9101b6c13835f629928d
https://doi.org/10.1016/j.tsf.2014.03.056
https://doi.org/10.1016/j.tsf.2014.03.056