Zobrazeno 1 - 5
of 5
pro vyhledávání: '"David Mistele"'
Publikováno v:
2022 IEEE 23rd Workshop on Control and Modeling for Power Electronics (COMPEL).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a10b0b1ce3531f6d648e9ac171858a8f
https://doi.org/10.1109/compel53829.2022.9829951
https://doi.org/10.1109/compel53829.2022.9829951
Publikováno v:
2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS).
Dimensions Optimization of LDMOS (Laterally Diffused Metal Oxide Semiconductor) Field Effect Transistors, utilizing SOX (Step Oxide) for drift region structuring, is studied. Using TCAD modeling and subsequent layout and process variations, based on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2cfe07abe3a5fce2fe3af23ba4f721d
https://doi.org/10.1109/comcas.2017.8244821
https://doi.org/10.1109/comcas.2017.8244821
Publikováno v:
2015 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS).
Power Management Integrated Circuits (PMIC) chips contain large power switches - usually LDMOS transistors, along with low current control circuitry. During transistor switching, charge carriers are injected into the substrate and affect the surround
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::512d17f7efb610a79fc05a7494851af9
https://doi.org/10.1109/comcas.2015.7360399
https://doi.org/10.1109/comcas.2015.7360399
Tunneling Emitter Bipolar Transistor as a Characterization Tool for Dielectrics and their Interfaces
Autor:
Eilam Yalon, Arkadi Gavrilov, Shimon Cohen, David Mistele, Boris Meyler, Joseph Salzman, Dan Ritter
Publikováno v:
ECS Meeting Abstracts. :1917-1917
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2594407705c66104194efb05cbb1cd1f
https://doi.org/10.1149/ma2011-02/27/1917
https://doi.org/10.1149/ma2011-02/27/1917
Publikováno v:
Semiconductor Science & Technology; Oct2011, Vol. 26 Issue 10, p105004-105004, 1p