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A Gaussian approximation theorem for L\'evy processes

Autor: Jorge Ignacio González Cázares, David Bang, Aleksandar Mijatović

Without higher moment assumptions, this note establishes the decay of the Kolmogorov distance in a central limit theorem for L\'evy processes. This theorem can be viewed as a continuous-time extension of the classical random walk result by Friedman,

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::05477bb71d439ab6bda86f920fadcfed
http://arxiv.org/abs/2104.13855

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Profile simulation of conformality of chemical vapor deposited copper in subquarter-micron trench and via structures

Autor: James P. McVittie, Joseph S. Han, John J. Sullivan, Eric Eisenbraun, Gregory Braeckelmann, Dirk Manger, Aaron Burke, James F. Loan, Alain E. Kaloyeros, David Bang

Publikováno v: Journal of Applied Physics. 82:4651-4660

Copper profile evolution in ultralarge scale integration via and trench structures was investigated for thermal low pressure, low temperature, chemical vapor deposition (LPCVD) from CuI(tmvs)(hfac). The investigation examined copper profiles in speci

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::af37c1593cdc16c6b08aeb69bfcd1058
https://doi.org/10.1063/1.366204

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Surveillance of health status in minority communities - Racial and Ethnic Approaches to Community Health Across the U.S. (REACH U.S.) Risk Factor Survey, United States, 2009

Autor: Youlian, Liao, David, Bang, Shannon, Cosgrove, Rick, Dulin, Zachery, Harris, April, Taylor, Shannon, White, Graydon, Yatabe, Leandris, Liburd, Wayne, Giles

Publikováno v: Morbidity and mortality weekly report. Surveillance summaries (Washington, D.C. : 2002). 60(6)

Substantial racial/ethnic health disparities exist in the United States. Although the populations of racial and ethnic minorities are growing at a rapid pace, large-scale community-based surveys and surveillance systems designed to monitor the health

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid________::3436ca8c4e6ae3a474648823aef519aa
https://pubmed.ncbi.nlm.nih.gov/21597458

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Racial and ethnic approaches to community health: reducing health disparities by addressing social determinants of health

Autor: Aisha Penson, Joyce Buckner-Brown, Pattie Tucker, David Bang, James L. Coleman, Shannon Cosgrove, Mark Rivera

Publikováno v: Familycommunity health. 34

Poor people and people of color are more likely to live shorter and sicker lives and are less likely to survive a host of chronic illnesses. Policies and organizational practices that improve the environments in which people live, work, learn, and pl

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::53102adea5b24b8a514dd0f3a50b65fd
https://pubmed.ncbi.nlm.nih.gov/21160327

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Pathfinding for 22nm CMOS designs using Predictive Technology Models

Autor: Wei Zhao, Zhi Zhu, David Bang, Chi-Chao Wang, Joseph Wang, Seung H. Kang, Matt Nowak, Jooyoung Song, Yu Cao, Nick Yu, Xia Li

Publikováno v: CICC

Traditional IC scaling is becoming increasingly difficult at the 22nm node and beyond. Dealing with these challenges increase product development cycle time. For continued CMOS scaling, it is essential to start design explorations in new process node

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ec4b6bd3d0f4db5348967542446c7a92
https://doi.org/10.1109/cicc.2009.5280845

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Time dependent dielectric wearout (TDDW) technique for reliability of ultrathin gate oxides

Autor: Qi Xiang, Gerald Lucovsky, David Bang, Ming-Ren Lin, Y. Wu

Publikováno v: IEEE Electron Device Letters. 20:262-264

The degradation of ultrathin oxides is measured and characterized by the dual voltage time dependent dielectric wearout (TDDW) technique. Compared to the conventional time-dependent dielectric breakdown (TDDB) technique, a distinct breakdown can be d

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::702b583d3507a76baa71e23a7fc6549f
https://doi.org/10.1109/55.767092

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Performance and reliability of sub-100 nm MOSFETs with ultra thin direct tunneling gate oxides

Autor: Khaled Ahmed, Ming-Ren Lin, David Bang, Geoffrey Choh-Fei Yeap, Miryeong Song, Qi Xiang, Effiong Ibok

Publikováno v: 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).

Summary form only given. In this paper, we report the performance and reliability of sub-100 nm MOSFETs with ultra thin direct tunneling (DT) gate oxides. Both pure oxides and nitrided oxides down to 17 /spl Aring/ were investigated. For a L/sub g/ o

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d72ea41c3e1daea76d207a5f3c42ee36
https://doi.org/10.1109/vlsit.1998.689240

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Sub-100 nm nMOSFETs with direct tunneling thermal, nitrous and nitric oxides

Autor: Geoffrey Choh-Fei Yeap, Effiong Ibok, Miryeong Song, Khaled Ahmed, Ming-Ren Lin, Qi Xiang, David Bang

Publikováno v: 56th Annual Device Research Conference Digest (Cat. No.98TH8373).

Performance and reliability of sub-100 nm gate length devices using a dual gate and shallow trench isolated CMOS technology were investigated. Ultra-thin direct tunneling (DT) thermal, nitrous and nitric oxides as thin as 1.3 nm are used. Only N-MOS

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::baa4bb0b556d79d31dd8f63d69019ba7
https://doi.org/10.1109/drc.1998.731099

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