Feasibility of single question mental health surveillance in chronic disease

Autor: Mary White, Rachel Pelly, Jane Le, Lucy Dove, Sarah Connolly, Alice Morgan, Dave Reid, Ric Haslam, Harriet Hiscock

Publikováno v: Archives of disease in childhood.

ObjectiveTo determine the (1) feasibility and acceptability of administering single question mental health surveillance to carers of children with chronic disease in the inpatient setting and (2) sensitivity, specificity, positive predictive value (P

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66d758fb6af08e1ac8760522ac7781d1
https://pubmed.ncbi.nlm.nih.gov/35680403

Are fish sensitive to trawling recovering in European waters?

Autor: Anna Rindorf, Henrik Gislason, Dave Reid

Publikováno v: Rindorf, A, Gislason, H & Reid, D 2019, Are fish sensitive to trawling recovering in European waters? in ASC abstracts and CM-documents 2019 ., H:634, International Council for the Exploration of the Sea (ICES), ICES Annual Science Conference 2019, Gothenburg, Sweden, 09/09/2019 .
Technical University of Denmark Orbit

For the past couple of decades, the fishing pressure induced by towed demersal gear has decreased and this decrease may have allowed the number of sensitive fish in the sea to increase. Here we use the fact that the sensitivity of fish to trawl induc

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::fc5b9ab6734609bbcd2e8b37a0976569
https://orbit.dtu.dk/en/publications/f4e3d020-e652-4a3c-af2c-ebad5a801124

Accurate Simulation of Transistor-Level Variability for the Purposes of TCAD-Based Device-Technology Cooptimization

Autor: Campbell Millar, Salvatore Maria Amoroso, Michael Hargrove, Binjie Cheng, Ken Greiner, Asen Asenov, Louis Gerrer, Razaidi Hussin, David M. Fried, Craig Alexander, Dave Reid, Andrew R. Brown

Publikováno v: IEEE Transactions on Electron Devices. 62:1739-1745

In this paper we illustrate how the predictive Technology Computer Aided Design (TCAD) process device simulation can be used to evaluate process, statistical, and time-dependent variability at the early stage of the development of new technology. Thi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::58572e605ad37d85cc63a3112893354a
https://doi.org/10.1109/ted.2015.2402440

Statistical Enhancement of the Evaluation of Combined RDD- and LER-Induced $V_{T}$ Variability: Lessons From $\hbox{10}^{5}$ Sample Simulations

Autor: Asen Asenov, Scott Roy, Campbell Millar, Dave Reid

Publikováno v: IEEE Transactions on Electron Devices. 58:2257-2265

Using full-scale 3-D simulations of 100 000s of devices, enabled by “push-button” cluster technology, we study in detail statistical threshold voltage variability in a state-of-the-art n-channel MOSFET introduced by the combined effect of random

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c9de24b009c2e7e7b5cbaa660a35d601
https://doi.org/10.1109/ted.2011.2147317

Understanding LER-Induced MOSFET $V_{T}$ Variability—Part I: Three-Dimensional Simulation of Large Statistical Samples

Autor: Asen Asenov, Campbell Millar, Scott Roy, Dave Reid

Publikováno v: IEEE Transactions on Electron Devices. 57:2801-2807

In this paper, using computationally intensive 3-D simulations in a grid computing environment, we perform a detailed study of line-edge-roughness (LER)-induced threshold voltage variability in contemporary MOSFETs. Statistical ensembles of tens of t

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::111608344e7a7397c99f36697f5af71d
https://doi.org/10.1109/ted.2010.2067731