Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Dave Petrick"'
Autor:
Hak Kim, D. Espinosa, Melanie D. Berg, Dave Petrick, A. Lesea, C. Poivey, M. Friendlich, A. Phan, Ken LaBel
Publikováno v:
IEEE Transactions on Nuclear Science. 55:2259-2266
A comparison of two scrubbing mitigation schemes for Xilinx field programmable gate array (FPGA) devices is presented. The design of the scrubbers is briefly discussed along with an examination of mitigation limitations. Heavy ion data are then prese
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::321fe7d6f9477fa035a5ff8985bdf5e9
https://doi.org/10.1109/tns.2008.2001422
https://doi.org/10.1109/tns.2008.2001422
Autor:
Paul W. Marshall, James Forney, C. Poivey, Dave Petrick, S.R. Cox, Ray Ladbury, S.P. Buchner, D.K. Hawkins, Mark P. Baze, Anthony Dung-phan, Martin A. Carts, Martha V. O'Bryan, S.D. Kniffin, Christina Seidleck, Jeremy Karsh, A.B. Sanders, Kenneth A. LaBel, Cheryl J. Marshall, Melanie D. Berg, J.W. Howard, Hak Kim, Ryan Flanigan, M. Friendlich, T.R. Oldham, Wes Powell, T.L. Irwin
Publikováno v:
2007 IEEE Radiation Effects Data Workshop.
Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e2f1ee628870278c3efa00c683b8b39
https://doi.org/10.1109/redw.2007.4342557
https://doi.org/10.1109/redw.2007.4342557
Autor:
Martha O'Bryan, Christian Poivey, Scott Kniffin, Stephen Buchner, Ray Ladbury, Timothy Oldham, James Howard, Kenneth LaBel, Anthony Sanders, Melanie Berg, Cheryl Marshall, Paul Marshall, Hak Kim, Anthony Dung-phan, Donald Hawkins, Martin Carts, James Forney, Tim Irwin, Christina Seidleck, Stephen Cox, Mark Friendlich, Ryan Flanigan, Dave Petrick, Wes Powell, Jeremy Karsh, Mark Baze
Publikováno v:
2006 IEEE Radiation Effects Data Workshop.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8db4be964dfbf686562d9542579d66d
https://doi.org/10.1109/redw.2006.295463
https://doi.org/10.1109/redw.2006.295463