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pro vyhledávání: '"Dave Kolar"'
Publikováno v:
Journal of The Electrochemical Society. 144:1849-1854
By depositing collimated titanium at near room temperature, a preferred (002) oriented Ti film is formed. These (002) Ti films showed uniform grain size distributions and a smooth surface topography. In contrast, collimated Ti using conventional depo
Publikováno v:
Journal of The Electrochemical Society. 142:3893-3896
A metallization stack is fabricated using a tungsten cap layer on top of the aluminum interconnect. Utilizing this stack significantly reduces the possibility of process-induced defectivity problems : formation of via veils, metal extrusions, and bre
Autor:
Rajan Nagabushnam, Scott C. Bolton, Paul G. Y. Tsui, Ted R. White, H. Chuang, Dave Kolar, Larry Pulvirent, Larry E. Frisa, Mohamed Jahanbani, Jeff Cope
Publikováno v:
SPIE Proceedings.
This work compares the extendibility of titanium with pre- deposition amorphizing implant (PAI) and cobalt salicides to sub-0.25 micrometer technologies. Cobalt salicide has low sheet resistance and a tighter distribution of sheet resistances than ti
Publikováno v:
Handbook of Critical Dimension Metrology and Process Control: A Critical Review.
Pareto analysis has become one of the most important and widely used tools in solving quality problems. The usefulness of Pareto analysis extends well beyond the application to defect data being applicable to most every department in a company includ
Conference
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