Zobrazeno 1 - 10
of 541
pro vyhledávání: '"Davanco, M."'
Cavity optomechanical systems are being widely developed for precision force and displacement measurements. For nanomechanical transducers, there is usually a trade-off between the frequency ($f_{M}$) and quality factor ($Q_{M}$), which limits tempor
Externí odkaz:
http://arxiv.org/abs/1508.00067
Publikováno v:
Optica, Vol. 1. No. 6, pp. 414-420 (2014)
Chip-based cavity optomechanical systems are being considered for applications in sensing, metrology, and quantum information science. Critical to their development is an understanding of how the optical and mechanical modes interact, quantified by t
Externí odkaz:
http://arxiv.org/abs/1409.6198
Publikováno v:
Appl. Phys. Lett. 99, 121101 (2011)
We demonstrate a spectrally broadband and effcient technique for collecting photoluminescence from a single InAs quantum dot directly into a standard single mode optical fiber. In this approach, an optical fiber taper waveguide is placed in contact w
Externí odkaz:
http://arxiv.org/abs/1104.4036
Publikováno v:
Appl. Phys. Lett. 99, 041102 (2011)
We demonstrate a nanostructure composed of partially etched annular trenches in a suspended GaAs membrane, designed for efficient and moderately broadband (approx. 5 nm) emission extraction from single InAs quantum dots. Simulations indicate that a d
Externí odkaz:
http://arxiv.org/abs/1104.0271
Publikováno v:
Optics express [Opt Express] 2024 May 20; Vol. 32 (11), pp. 20360-20369.
Autor:
Chanana A; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Institute for Research in Electronics and Applied Physics and Maryland NanoCenter, University of Maryland, College Park, MD, USA.; Theiss Research, La Jolla, CA, USA., Larocque H; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Moreira R; Department of Electrical and Computer Engineering, University of California Santa Barbara, Santa Barbara, CA, USA., Carolan J; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.; Wolfson Institute for Biomedical Research, University College London, London, UK., Guha B; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, MD, USA., Melo EG; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Materials Engineering Department, Lorena School of Engineering, University of São Paulo, Lorena, SP, Brazil., Anant V; Photon Spot, Inc., Monrovia, CA, USA., Song J; Center for Opto-Electronic Materials and Devices, Korea Institute of Science and Technology, Seoul, 02792, South Korea., Englund D; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Blumenthal DJ; Department of Electrical and Computer Engineering, University of California Santa Barbara, Santa Barbara, CA, USA., Srinivasan K; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, MD, USA., Davanco M; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA. marcelo.davanco@nist.gov.
Publikováno v:
Nature communications [Nat Commun] 2022 Dec 12; Vol. 13 (1), pp. 7693. Date of Electronic Publication: 2022 Dec 12.
Publikováno v:
Optics letters [Opt Lett] 2023 Sep 01; Vol. 48 (17), pp. 4516-4519.
Autor:
Lu X; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA., Sun Y; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA., Chanana A; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Javid UA; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA., Davanco M; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Srinivasan K; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA.
Publikováno v:
Photonics research [Photonics Res] 2023; Vol. 11 (11).
Autor:
Wang M; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20742, USA., Zhou F; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA., Lu X; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA., McClung A; Department of Electrical and Computer Engineering, University of Massachusetts Amherst, Amherst, Massachusetts 01003, USA., Davanco M; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Aksyuk VA; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Srinivasan K; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2022 Oct 28; Vol. 129 (18), pp. 186101.
Publikováno v:
Optics letters [Opt Lett] 2022 Jul 01; Vol. 47 (13), pp. 3331-3334.