Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Darin A. York"'
Autor:
Austin H. Roach, Tammy J. Berger, Matthew J. Gadlage, Dobrin P. Bossev, Darin A. York, Adam R. Duncan, James D. Ingalls, Aaron M. Williams, Carl M. Szabo, Kenneth A. LaBel, Matthew J. Kay
Publikováno v:
International Symposium for Testing and Failure Analysis.
This work investigates the origin of the single event hard failures of an advanced commercial FinFET microprocessor induced by heavy ions using a combination of failure analysis tools. It focuses on elucidating the reason behind the hard and catastro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97f9880f0c70f003f4981bd2284c1a9c
https://doi.org/10.31399/asm.cp.istfa2016p0555
https://doi.org/10.31399/asm.cp.istfa2016p0555
