Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Dao-Guang Liu"'
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789811911804
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b45c14ce967f7da72bc0f82cd6a0e8d
https://doi.org/10.1007/978-981-19-1181-1_17
https://doi.org/10.1007/978-981-19-1181-1_17
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789811911804
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d13c8c72e9e9e0470c3bbaf72cc5f905
https://doi.org/10.1007/978-981-19-1181-1_18
https://doi.org/10.1007/978-981-19-1181-1_18
Publikováno v:
2020 39th Chinese Control Conference (CCC).
During the commissioning of Nuclear power plant unit, it is necessary to perform the transient condition test that the single pump operation of Main Feedwater (APA) pump triggers the rapid load rejection of steam turbine. Due to the sudden loss of a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a19da02379257b154ce1e663ba0845a
https://doi.org/10.23919/ccc50068.2020.9188734
https://doi.org/10.23919/ccc50068.2020.9188734
Autor:
Jun Xu, Daniel M. Fleetwood, Dao Guang Liu, Han Liang Bo, En Xia Zhang, Wei Song Zhou, T. P. Ma, Shufeng Ren, Ronald D. Schrimpf, Xin Wan
Publikováno v:
IEEE Transactions on Nuclear Science. 62:2830-2836
Simulations of the SEB hardness of power MOSFETs are carried out with an experimentally calibrated structure. The effects of incorporating high permittivity gate dielectric layers and increasing channel doping concentration are investigated. The simu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c426f18ff4a9d6a22f3f6dd60deb0b7
https://doi.org/10.1109/tns.2015.2498145
https://doi.org/10.1109/tns.2015.2498145