Zobrazeno 1 - 10
of 87
pro vyhledávání: '"Danto, Yves"'
Autor:
Mendizabal, Laurent, Verdier, Frédéric, Deshayes, Yannick, Ousten, Yves, Danto, Yves, Béchou, Laurent
Publikováno v:
In Advanced Laser Diode Reliability 2021:79-137
Publikováno v:
Advances in Technology Innovation, Vol 3, Iss 3, Pp 126-132 (2018)
Journal of Advances In Technology Innovation
Journal of Advances In Technology Innovation, Taiwan Association of Engineering and Technology Innovation, 2018, 20 (3), pp.126-132
Journal of Advances In Technology Innovation, 2018, 20 (3), pp.126-132
Journal of Advances In Technology Innovation
Journal of Advances In Technology Innovation, Taiwan Association of Engineering and Technology Innovation, 2018, 20 (3), pp.126-132
Journal of Advances In Technology Innovation, 2018, 20 (3), pp.126-132
International audience; This paper reports an innovative pedagogic experience performed at South-East University (SEU) with electrical engineering Bachelor honors students (computer science, mechanics, and electronics). The purpose was to develop the
Publikováno v:
In Microelectronics Reliability 2003 43(9):1821-1826
Autor:
Darracq, Frédéric, Lapuyade, Herve, Fouillat, Pascal, Pouget, Vincent, Lewis, Dean, Danto, Yves
Publikováno v:
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems, Brazilian Microelectronics Society, 2006, 1 (3), pp.11-16
Journal of Integrated Circuits and Systems, Brazilian Microelectronics Society, 2006, 1 (3), pp.11-16
International audience; This paper proposes a complete method dedicated to the evaluation of SRAMs sensitivity to single event upsets using ultrashort laser pulses.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::2458064598b977cec0fcd51b5d2b0434
https://hal.archives-ouvertes.fr/hal-00359396
https://hal.archives-ouvertes.fr/hal-00359396