Zobrazeno 1 - 10
of 166
pro vyhledávání: '"Danilewsky, A.N."'
Publikováno v:
In Journal of Crystal Growth 1 June 2021 563
Publikováno v:
In Microelectronics Reliability August 2019 99:232-238
Publikováno v:
In Journal of Crystal Growth 15 May 2017 466:16-21
Autor:
Cowley, A., Ivankovic, A., Wong, C.S., Bennett, N.S., Danilewsky, A.N., Gonzalez, M., Cherman, V., Vandevelde, B., De Wolf, I., McNally, P.J.
Publikováno v:
In Microelectronics Reliability April 2016 59:108-116
Autor:
Oriwol, D., Carl, E.-R., Danilewsky, A.N., Sylla, L., Seifert, W., Kittler, M., Leipner, H.S.
Publikováno v:
In Acta Materialia October 2013 61(18):6903-6910
Autor:
Danilewsky, A.N., Wittge, J., Croell, A., Allen, D., McNally, P., Vagovič, P., dos Santos Rolo, T., Li, Z., Baumbach, T., Gorostegui-Colinas, E., Garagorri, J., Elizalde, M.R., Fossati, M.C., Bowen, D.K., Tanner, B.K.
Publikováno v:
In Journal of Crystal Growth 1 March 2011 318(1):1157-1163
Publikováno v:
In Journal of Crystal Growth 1 March 2011 318(1):558-562
Autor:
Stopford, J., Allen, D., Aldrian, O., Morshed, M., Wittge, J., Danilewsky, A.N., McNally, P.J.
Publikováno v:
In Microelectronic Engineering 2011 88(1):64-71
Autor:
Kallinger, B., Polster, S., Berwian, P., Friedrich, J., Müller, G., Danilewsky, A.N., Wehrhahn, A., Weber, A.-D.
Publikováno v:
In Journal of Crystal Growth 2011 314(1):21-29
Autor:
Matuchova, M., Zdansky, K., Zavadil, J., Tonn, J., Abdul-Gader Jafar, Mousa M., Danilewsky, A.N., Cröll, A., Maixner, J.
Publikováno v:
In Journal of Crystal Growth 2010 312(8):1233-1239