Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Daniel W. Oblas"'
Publikováno v:
Langmuir. 24:371-374
Nanocrystalline zinc oxide has been functionalized with 11-triethoxysilylundecal to introduce chemical reactivity for subsequent molecular attachment while preserving its unique photoluminescence (PL) properties. Silane bonding is confirmed using FTI
Publikováno v:
Journal of Applied Physics. 92:1576-1581
Light emitting electrochemical cells based on the tris(2,2′ bipyridyl) ruthenium(II) complex show improved performance if electrochemically stable materials such as Ag are used as the cathode material. In contrast, if Al is used as the cathode such
Autor:
Stephen A. Fossey, Luis J. Matienzo, Young-Hoon Kim, Anastasios P. Angelopoulos, Daniel W. Oblas
Publikováno v:
Macromolecules. 34:7489-7495
Time-dependent adsorption of a high-molecular-weight cationic polyacrylamide (acrylamide/β-methacryloxyethyltrimethylammonium methyl sulfate copolymer) from sulfuric acid solution onto a perfluorosulfonate ionomer (Nafion) membrane was characterized
Publikováno v:
SPIE Proceedings.
Recent development of low-loss, Er-doped silica fibers has made deployment of optical amplifiers in today's optical communication networks a reality. Among several techniques used for fabricating rare-earth doped fibers, the solution-doping technique
Autor:
Mahendra P. Singh, T. Michael Wei, Francis Pink, Joseph Connolly, Daniel W. Oblas, Donald L. Dugger
Publikováno v:
MRS Proceedings. 244
The distribution and concentration of dopants in the core of an optical fiber, at low concentrations, particularly the rare earth dopants, are difficult to measure quantitatively. However, such information is critical to the determination of absorpti
Publikováno v:
Langmuir; Jan2008, Vol. 24 Issue 2, p371-374, 4p
Autor:
William W. Y. Lee, Daniel W. Oblas
Publikováno v:
Journal of Applied Physics. 46:1728-1732
Sputtered films of 12 elementary metals were analyzed for argon content by an rf spark−source mass−spectrographic method. All films were deposited using dc triode sputtering under similar conditions. Corrections in the data have been made to acco
Autor:
William W. Lee, Daniel W. Oblas
Publikováno v:
Journal of Vacuum Science and Technology. 7:129-133
The relative argon concentrations of dc-sputtered tungsten films were determined as a function of argon pressure, target-to-substrate voltage, substrate bias, and target-to-substrate distance, for both the diode and triode configurations. The results
Autor:
Daniel W. Oblas
Publikováno v:
Applied Spectroscopy. 25:325-328
Experimentally determined sensitivity factors for the rare earths in Y2O3 are presented along with computed values based upon some electrical and physical properties of the elements and compounds. The sample electrodes consisted of 2 mol of pelletizi
Autor:
Donald L. Dugger, Daniel W. Oblas
Publikováno v:
Journal of Vacuum Science and Technology. 17:826-828
A simple modification to the spark shield of the ion source of a spark source mass spectrograph is discussed. This helps to maintain a low partial pressure of residual gases during sparking of reactive materials. A grid is placed over the viewing sli