Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Daniel R. Knebel"'
Publikováno v:
IEEE Transactions on Circuits and Systems II: Express Briefs. 54:586-590
Most existing power gating structures provide only one power-saving mode. We propose a novel power gating structure that supports both a cutoff mode and an intermediate power-saving and data-retaining mode. Experiments with test structures fabricated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a0decda330b61f15914ff65e8edea85
https://doi.org/10.1109/tcsii.2007.894428
https://doi.org/10.1109/tcsii.2007.894428
Autor:
Melanie J. Sherony, M. Rivier, P. O'Neil, Yue Tan, Asit Kumar Ray, Mohamed Talbi, Lawrence F. Wagner, N. E. Lustig, Kun Wu, Jean-Olivier Plouchart, Daniel R. Knebel, David M. Friend, Keith A. Jenkins, Shreesh Narasimha, Noah Zamdmer, Jae-Joon Kim, Seong-Dong Kim, M. Rohn, J. Strom, Nghia Van Phan, Stephen V. Kosonocky
Publikováno v:
IBM Journal of Research and Development. 47:611-629
Systems-on-chips (SoCs) that combine digital and high-speed communication circuits present new opportunities for power-saving designs. This results from both the large number of system specifications that can be traded off to minimize overall power a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::633d40ed5e325788daaee2180304ba88
https://doi.org/10.1147/rd.475.0611
https://doi.org/10.1147/rd.475.0611
Autor:
Victor Zyuban, Ken K. Chin, W. Hwang, Suhwan Kim, Kevin Wilson Warren, George D. Gristede, Daniel R. Knebel, M. B. Ketchen, Azeez Bhavnagarwala, Stephen V. Kosonocky, A.-M. Haen
Publikováno v:
IBM Journal of Research and Development. 47:283-298
As CMOS technology scales to deep-submicron dimensions, designers face new challenges in determining the proper balance between aggressive high-performance transistors and lower-performance transistors to optimize system power and performance for a g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1518922d6b533861fefafba525c0ce8
https://doi.org/10.1147/rd.472.0283
https://doi.org/10.1147/rd.472.0283
Autor:
William V. Huott, Steven E. Steen, Jeffrey A. Kash, James C. Tsang, Stas Polonsky, M.K. Mc Manus, Daniel R. Knebel
Publikováno v:
Microelectronics Reliability. 40:1353-1358
Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c5862ed95a5f8e0b212bd4ddc2b81ad
https://doi.org/10.1016/s0026-2714(00)00137-2
https://doi.org/10.1016/s0026-2714(00)00137-2
Publikováno v:
IBM Journal of Research and Development. 43:899-914
This paper describes the strategies and techniques used to diagnose failures in the IBM 600-MHz S/390® G5 (Generation 5) CMOS microprocessor and the associated cache chips. The complexity, density, cycle time, and technology issues related to the ha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d2fdf38a75de7db1fac3c5081056f6c
https://doi.org/10.1147/rd.435.0899
https://doi.org/10.1147/rd.435.0899
Publikováno v:
ISLPED
A novel power gating structure is proposed for low-power, high-performance VLSI. This power gating structure supports an intermediate power saving mode as well as a traditional power cut-off mode. To evaluate our power gating structure, we design and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::adb05713af0e9f13b0ca7b54ad617bdb
https://doi.org/10.1145/1013235.1013246
https://doi.org/10.1145/1013235.1013246
Autor:
David F. Heidel, Kevin Stawiasz, Daniel R. Knebel, Suhwan Kim, M. Immediato, Stephen V. Kosonocky
Publikováno v:
ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705).
A multiple power domain strategy in which each power domain has an independent power gating structure is an effective means for reducing leakage power consumption in a system-on-a-chip. During an individual power gating structure power-mode transitio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5bb3a9673470a362422dd300f938cbd7
https://doi.org/10.1109/esscirc.2003.1257215
https://doi.org/10.1109/esscirc.2003.1257215
Publikováno v:
2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408).
New SRAM circuit techniques implemented in a standard 0.13 /spl mu/m bulk Si CMOS process are reported in this work that (i) enable pico-joule energy dissipation per accessed bit at 1 GHz, (ii) lower total leakage power by over 80% from all unaccesse
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c836a601e4449983ae38b870ee00846
https://doi.org/10.1109/vlsic.2003.1221218
https://doi.org/10.1109/vlsic.2003.1221218
Autor:
Pia Naoko Sanda, H.F. Casal, E. Seewann, Daniel R. Knebel, Jeffrey A. Kash, M. Papermaster, James C. Tsang
Publikováno v:
1999 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition (Cat. No.99CH36278).
Picosecond imaging circuit analysis (PICA) is shown to be a valuable means for measuring internal timing of microprocessors operating at speed. In this paper, PICA is applied to the analysis of delays and skew of the IBM POWER3 64b microprocessor clo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76660f89b95a05edc0077d20393e2b8b
https://doi.org/10.1109/isscc.1999.759301
https://doi.org/10.1109/isscc.1999.759301
Autor:
Daniel R. Knebel, Moyra K. McManus, J. Lee, Peilin Song, Mary P. Kusko, Franco Motika, Richard F. Rizzolo
Publikováno v:
ITC
This paper describes strategies and techniques used to diagnose failures in the IBM 600 MHz G5 (Generation 5) CMOS microprocessor and associated cache chips. Time-to-market pressure demands quick diagnostic turnaround time while the complexity, densi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d69731b80f84f62f2841376ce07d3212
https://doi.org/10.1109/test.1999.805841
https://doi.org/10.1109/test.1999.805841