Zobrazeno 1 - 8
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pro vyhledávání: '"Daniel Peykov"'
Autor:
R. W. Paynter, Daniel Peykov
Publikováno v:
Surface and Interface Analysis. 48:54-63
Autor:
R.W. Paynter, Daniel Peykov
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 197:93-101
Composition depth profiles were extracted from simulated ARXPS data using regularization, with the regularization parameter determined by three different methods (Robust GCV, Modified GCV, and the Discrepancy Principle) that require tuning parameters
Autor:
Daniel Peykov, R.W. Paynter
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 193:63-78
Using 0th order Tikhonov regularization, we recovered concentration-depth profiles from simulated noisy ARXPS data using nine candidate methods for the selection of the regularization parameter α. Calculations were performed on 1000 noisy data sets
Autor:
Lisa Rodrigue, Matthew Gallaugher, Richard R. Chromik, Michel L. Trudeau, Raynald Gauvin, Daniel Peykov, Nicolas Brodusch
Publikováno v:
Journal of Nuclear Materials. 442:116-123
The Zr–2.5Nb pressure tube alloy used in Canada Deuterium Uranium (CANDU) nuclear reactors consists of a dual-phase microstructure produced by a multi-step manufacturing process. The metallurgical characteristics of the pressure tubes influence the
Publikováno v:
Journal of Materials Science. 47:7189-7200
Constant load measurements by nanoindentation offer the potential for measuring strain rate sensitivity from individual features and defects on a submicron scale. However, recent reports reveal a conflicting load dependence (both increasing and decre
Autor:
R.W. Paynter, Daniel Peykov
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 185:103-111
A matrix-based analytical solution to the inversion and regularization of ARXPS data is presented and its characteristics are explored. For each of the 4 different input concentration depth profiles tested, 50 different sets of noisy ARXPS data are s
Publikováno v:
Optics express. 23(8)
Using morphological and optical simulations of 1D tantalum photonic crystals at 1200K, surface diffusion was determined to gradually reduce the efficiency of selective emitters. This was attributed to shifting resonance peaks and declining emissivity
Autor:
Kent E. Coulter, Ronghua Wei, Robert Castillo, Ivan Celanovic, John D. Joannopoulos, Veronika Stelmakh, Jay J. Senkevich, Daniel Peykov, Marin Soljacic, Walker R. Chan
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 33:061204
Thick sputtered tantalum (Ta) coatings on polished Inconel were investigated as a potential replacement for bulk refractory metal substrates used for high-temperature emitters and absorbers in thermophotovoltaic energy conversion applications. In the