Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Daniel Monteiro Diniz Reis"'
Publikováno v:
2022 IEEE International Reliability Physics Symposium (IRPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::106ab88d2b91bcb222b1f8cfbf5645fe
https://doi.org/10.1109/irps48227.2022.9764566
https://doi.org/10.1109/irps48227.2022.9764566
Publikováno v:
Applied Physics Letters. 121:209901
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10949f2165c9f861b2eddeb6b1d5b4d6
https://doi.org/10.1063/5.0132795
https://doi.org/10.1063/5.0132795
Publikováno v:
Applied Physics Letters. 121:162902
The reliability of piezoelectric thin films is crucial for piezoelectric micro-electromechanical system applications. The understanding of resistance degradation in piezoelectric thin films requires knowledge about point defects. Here, we show the re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5536e3978914815c893f9dce19c23c5b
https://doi.org/10.1063/5.0106382
https://doi.org/10.1063/5.0106382
Publikováno v:
2021 IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM).
The resistance degradation of sputtered doped lead zirconate titanate thin film resulting from the lowering of the Schottky barrier height was identified by current-voltage characterization over degradation. In addition to migration of oxygen vacanci
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::762fb2b2ad1fc40b023abc123808b21b
https://doi.org/10.1109/icpadm49635.2021.9493888
https://doi.org/10.1109/icpadm49635.2021.9493888
Publikováno v:
2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF).
Leakage current degradation in a state-of-the-art integrated low-temperature PVD lead zirconate titanate (PZT) thin film stack is investigated over temperature and applied electric field for samples processed at three different conditions. It is demo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8acc70457bab3556c96b8a46eb55c8ae
https://doi.org/10.1109/ifcs-isaf41089.2020.9234941
https://doi.org/10.1109/ifcs-isaf41089.2020.9234941
Publikováno v:
Microelectronics Reliability. :835-839
Reliability and integration of Lead Zirconate Titanate (PZT) is still a strong concern regarding its commercialization. In this work an approach to include reliability on wafer-level for integration and process development is presented. Long-term lea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::158e8e5fdae059256a56bbb808891dc4
https://doi.org/10.1016/j.microrel.2018.06.060
https://doi.org/10.1016/j.microrel.2018.06.060
Publikováno v:
2019 IEEE International Symposium on Applications of Ferroelectrics (ISAF).
In this work an enhanced physical model for leakage current degradation in lead zirconate titanate thin films is proposed and degradation kinetics are studied experimentally. For the first time, more than two defect species being active and manifesti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55163a5943714ec31e6a52d4b6fc0768
https://doi.org/10.1109/isaf43169.2019.9034930
https://doi.org/10.1109/isaf43169.2019.9034930
Publikováno v:
2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII).
Lead Zirconate Titanate (PZT) thin films are important for many applications in MEMS e.g. micro-mirrors, micro-speakers, or print heads. In this work reliability of an integrated low-temperature PVD PZT thin film stack for the important case of unipo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36c77d3d8edaf0d90a114fdc96c86bf3
https://doi.org/10.1109/transducers.2019.8808421
https://doi.org/10.1109/transducers.2019.8808421