Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Daniel L. Lepkowski"'
Autor:
Jacob T. Boyer, Steven A. Ringel, Daniel J. Chmielewski, Tyler J. Grassman, Daniel L. Lepkowski
Publikováno v:
IEEE Journal of Photovoltaics. 11:408-414
A high-performance metamorphic Al0.2Ga0.8As0.75P0.25/GaAs0.75P0.25 heterojunction tunnel junction structure was developed for application to monolithic epitaxial GaAs0.75P0.25/Si 1.7 eV/1.1 eV bandgap tandem solar cells produced via metal-organic che
Publikováno v:
IEEE Journal of Photovoltaics. 11:400-407
This work explores epitaxially integrated distributed Bragg reflectors (DBR) as a strategy to mitigate the impact of threading dislocations on the performance of monolithic GaAs0.75P0.25/Si tandem solar cells. The constraints present because of mater
Publikováno v:
Crystal Growth & Design. 20:6939-6946
The novel use of a GaAsyP1-y/GaP compressively-strained superlattice (CSS) to provide enhanced control over misfit dislocation (MD) evolution and threading dislocation density (TDD) during GaP/Si m...
Autor:
Steven A. Ringel, Daniel J. Chmielewski, Tyler J. Grassman, Daniel L. Lepkowski, Jacob T. Boyer, Tal Kasher
Publikováno v:
IEEE Journal of Photovoltaics. 10:758-764
This article highlights the critical role of window design on short circuit carrier collection in rear-emitter solar cells, as demonstrated through modeling and experiment using metamorphic GaAsyP1-y. Ultimately, if the window design is not carefully
Autor:
Steven A. Ringel, Daniel J. Chmielewski, Amber C. Silvaggio, Tyler J. Grassman, Daniel L. Lepkowski, Jacob T. Boyer
Publikováno v:
IEEE Journal of Photovoltaics. 9:1644-1651
A rear-emitter (rear-junction) n -on- p + device design was investigated for use in metamorphic monolithic III–V/Si tandem solar cells as an alternative to the traditional front-emitter (front-junction) n +-on- p design for potentially greater resi
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
Threading dislocation density (TDD) is a key parameter that commonly limits the performance of epitaxially integrated III-V/Si photovoltaics. The GaP/Si epitaxial bridge is a widely studied III-V on Si integration pathway, and recent advances have re
Autor:
Daniel L. Lepkowski, Stephen Bremner, Jacob T. Boyer, Tyler J. Grassman, Hamid Mehrvarz, Mattias K. Juhl, Udo Römer, Zak H. Blumer, Anastasia Soeriyadi, Chuqi Yi, Tal Kasher, Steven A. Ringel, Anita Ho-Baillie
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
Historically, the performance of monolithically-integrated GaAsP/Si tandem solar cells has been limited by the presence of elevated TDD in the GaAsP subcell. However, our recent development of low-TDD GaAsP/Si virtual substrates has greatly improved
Autor:
Jacob T. Boyer, William Nemeth, Vincenzo LaSalvia, Emily L. Warren, Emily A. Makoutz, Daniel L. Lepkowski, Theresa E. Saenz, Tyler J. Grassman, Steven A. Ringel
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
The degradation of photocarrier bulk lifetime in Si wafer substrates during the heteroepitaxial growth of III-V materials has been widely reported and is known to limit the efficiency of III-V/Si tandem solar cells. There have been prior strategies t
Autor:
Jacob T. Boyer, Steven A. Ringel, Ari N. Blumer, Daniel L. Lepkowski, Zak H. Blumer, Tyler J. Grassman, Francisco A. Rodriguez
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
Metamorphic III-V/Si materials with low threading dislocation density (TDD) are critical to realizing high-efficiency III-V/Si multijunction photovoltaics. In pursuit of a dual junction III-V/Si design with a GaAs 0.75 P 0.25 top junction epitaxially
Autor:
Steven A. Ringel, Daniel Derkacs, Zak H. Blumer, Stephen Bremner, Anita Ho-Baillie, Chuqi Yi, Anastasia Soeriyadi, Daniel L. Lepkowski, Alex Stavrides, Tyler J. Grassman, Mattias K. Juhl, Chris Kerestes, Jacob T. Boyer, Hamid Mehrvarz
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
Detailed loss analysis of our previously reported 21.8% (unverified) monolithic GaAsP/Si tandem cells has identified and quantified three main mechanisms limiting cell performance: dislocation mediated voltage and current losses, improper bandgap pro