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pro vyhledávání: '"Daniel J. Vitkavage"'
Autor:
Julia Svirchevski, Karen A. Reinhardt, Guang Ying Zhang, Marie Mitchel, David G. Hansen, Daniel J. Vitkavage, Daniel A. Koos, Frank Huang
Publikováno v:
Solid State Phenomena. :291-296
Introduction Cleaning is required following CMP (chemical mechanical planarization) to remove particles as well as metallic and organic contamination. Particle and contamination requirements tighten with each successive technology generation, and the
Autor:
Daniel A. Koos, Julia Svirchevski, Daniel J. Vitkavage, David G. Hansen, Karen A. Reinhardt, Frank Huang, Marie Mitchel, Guang Ying Zhang
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0378c33a262b84120e16f770289e24c9
https://doi.org/10.4028/3-908451-06-x.291
https://doi.org/10.4028/3-908451-06-x.291