Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Daniel Hoolihan"'
Autor:
Danielle K. Bayoro, Herman Groepenhoff, Daniel Hoolihan, Edward A. Rose, Michael J. Pedro, Andreas D. Waldmann
Publikováno v:
BMC Anesthesiology, Vol 22, Iss 1, Pp 1-7 (2022)
Abstract Background Perioperative hypothermia is a common occurrence, particularly with the elderly and pediatric age groups. Hypothermia is associated with an increased risk of perioperative complications. One method of preventing hypothermia is war
Externí odkaz:
https://doaj.org/article/bfe8764f77b74806921bb86ed5940246
Autor:
Daniel Hoolihan
Publikováno v:
IEEE Electromagnetic Compatibility Magazine. 10:29-33
Current guidelines recommend the use of an intravenous fluid warmer to prevent perioperative hypothermia. Among the various methods of warming intravenous fluids, contact warmers are among the most effective and accurate, particularly in clinical con
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::687f20cf68662df7b48bda8765679a42
https://doi.org/10.21203/rs.3.rs-1261429/v1
https://doi.org/10.21203/rs.3.rs-1261429/v1
Autor:
Andreas D. Waldmann, Daniel Hoolihan, Michael J. Pedro, Danielle Bayoro, Edward A. Rose, Herman Groepenhoff
Publikováno v:
BMC Anesthesiology, Vol 22, Iss 1, Pp 1-7 (2022)
Background Perioperative hypothermia is a common occurrence, particularly with the elderly and pediatric age groups. Hypothermia is associated with an increased risk of perioperative complications. One method of preventing hypothermia is warming the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6094da6dc39ffe26bdac31c3bcb3de0e
https://doi.org/10.21203/rs.3.rs-970986/v1
https://doi.org/10.21203/rs.3.rs-970986/v1
Autor:
Daniel Hoolihan
Publikováno v:
IEEE Electromagnetic Compatibility Magazine. 10:28-28
Autor:
Daniel Hoolihan
Publikováno v:
IEEE Electromagnetic Compatibility Magazine. 5:32-32
Autor:
Daniel Hoolihan
Publikováno v:
Journal of the IEST. 29:35-37
This report addresses the problems associated with developing a standardized test method for ESD. It does not delve into the multitudinous problems of ESD damage to computer chips. It does develop a background on ESD and its effects on electronic har