Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Daniel Esteban-Ferrer"'
Autor:
Lisa-Maria Needham, Steven F. Lee, Simon J. Davis, Ricardo Henriques, Christophe Leterrier, Ana Filipa L.O.M. Santos, James McColl, Anoushka Handa, Alexander R. Carr, Aleks Ponjavic, Daniel Esteban-Ferrer, Alexandre Kitching, Alexander Spark
Publikováno v:
Nat Methods
Nature Methods
Nature Methods, Nature Publishing Group, 2020, ⟨10.1038/s41592-020-0962-1⟩
Nature Methods, 2020, ⟨10.1038/s41592-020-0962-1⟩
Nature Methods
Nature Methods, Nature Publishing Group, 2020, ⟨10.1038/s41592-020-0962-1⟩
Nature Methods, 2020, ⟨10.1038/s41592-020-0962-1⟩
International audience; vLUME is a virtual reality software package designed to render large three-dimensional single-molecule localization micros-copy datasets. vLUME features include visualization, seg-mentation, bespoke analysis of complex local g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a90f64dd13cff826b00e76282596d309
Publikováno v:
ACS nano. 8(10)
We quantified the electrical polarization properties of single bacterial cells using electrostatic force microscopy. We found that the effective dielectric constant, ε(r,eff), for the four bacterial types investigated (Salmonella typhimurium, Escher
Publikováno v:
Nanotechnology. 24(50)
We analyze by means of finite-element numerical calculations the polarization force between a sharp conducting tip and a non-spherical uncharged dielectric nanoparticle with the objective of quantifying its dielectric constant from electrostatic forc
Publikováno v:
Nature Materials
Repositorio Institucional del Instituto Madrileño de Estudios Avanzados en Nanociencia
instname
Repositorio Institucional del Instituto Madrileño de Estudios Avanzados en Nanociencia
instname
Label-free detection of the material composition of nanoparticles could be enabled by the quantification of the nanoparticles' inherent dielectric response to an applied electric field. However, the sensitivity of dielectric nanoscale objects to geom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::daeedade612718c01a8954a3d832059e
http://hdl.handle.net/20.500.12614/2243
http://hdl.handle.net/20.500.12614/2243
Publikováno v:
Applied Physics Letters. 96:183107
Quantitative measurement of the low-frequency dielectric constants of thick insulators at the nanoscale is demonstrated utilizing ac electrostatic force microscopy combined with finite-element calculations based on a truncated cone with hemispherical