Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Daniel E. Geist"'
Autor:
D.I. Proskurovsky, Trevor F. Page, V. P. Rotshtein, John J. Vajo, Anthony J. Perry, J Taylor, A. B. Markov, Robert E. Doty, Steve Bull, Jesse N. Matossian, Daniel E. Geist, PC Rice-Evans
Publikováno v:
Metallurgical and Materials Transactions A. 30:2931-2939
Monolithic TiN coatings deposited onto cemented carbide cutting tool inserts coated by chemical vapor deposition (CVD) or physical vapor deposition (PVD) methods, respectively, were subjected to pulsed intense electron beam treatments in the energy r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::877a0d8a1d2d3aa9513c49f3a1ca6ca1
https://doi.org/10.1007/s11661-999-0130-9
https://doi.org/10.1007/s11661-999-0130-9
Autor:
P.C. Rice-Evans, Trevor F. Page, John J. Vajo, Steve Bull, Robert E. Doty, James Taylor, V. P. Rotshtein, Anthony J. Perry, Dmitri I. Proskurovsky, A. B. Markov, Jesse N. Matossian, Daniel E. Geist
Publikováno v:
Surface and Coatings Technology. :337-342
Monolithic TiN coatings deposited onto cemented carbide cutting tool inserts coated by PVD methods have been subjected to pulsed intense electron beam treatments in the energy range 3–5 J cm −2 . The temperature profiles for this rapid thermal pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f2dbbd6b14ed1649ec95444fe0db6e1
https://doi.org/10.1016/s0257-8972(99)00385-0
https://doi.org/10.1016/s0257-8972(99)00385-0
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 17:1848-1853
The present work is concerned with microstructural changes brought about by ion implantation into TiN as-deposited by classical chemical vapor deposition onto cemented carbide substrates. After implantation the ions occupy an implanted zone (IZ) exte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d9a0c5aa9bd5c60358fbd672ee0263d
https://doi.org/10.1116/1.581903
https://doi.org/10.1116/1.581903
Publikováno v:
Surface and Coatings Technology. :225-229
The residual stress in cemented carbide, specifically in the WC phase, following PVD and CVD coating processes is studied together with the effects of ion implantation post-treatment of the CVD-coated material. Over the depth range studied, the compr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6b20f86ecf21334a63bebd45629c8ec
https://doi.org/10.1016/s0257-8972(98)00670-7
https://doi.org/10.1016/s0257-8972(98)00670-7
Profiling the residual stress and integral strain distribution in yttrium implanted titanium nitride
Autor:
Anthony J. Perry, Daniel E. Geist
Publikováno v:
Vacuum. 48:833-838
The residual stress in ceramic materials is affected by ion implantation down to depths well below the zone where the implant resides, e.g. the implantation of TiN with NiTi dual or nitrogen ions has been shown to reduce the residual stress down t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e45fafa87d336a2aab9b1406f771d9e6
https://doi.org/10.1016/s0042-207x(97)00034-1
https://doi.org/10.1016/s0042-207x(97)00034-1
Autor:
Daniel E. Geist, Natalya V Girsova, Eduard V Kozlov, Alexei S Tailashev, Alexander I. Ryabchikov, Yurii P. Sharkeev, Anthony J. Perry
Publikováno v:
Thin Solid Films. :393-398
It is well known that after ion implantation, microstructural changes are found at depths well beyond the range of the implanted ions. In the present work samples of a disordered Ni3Fe alloy, implanted with four doses of a multicomponent ion beam (wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e75d05e79abb640e3b9b3f63420c6cc
https://doi.org/10.1016/s0040-6090(97)00590-7
https://doi.org/10.1016/s0040-6090(97)00590-7
Autor:
Anthony J. Perry, Daniel E. Geist
Publikováno v:
Surface and Coatings Technology. :309-314
The effect of implantation with the large, heavy ion, yttrium into TiN is measured over the depth range 0.1–2.6 μm. The results confirm the earlier work: a compressive stress is developed in the implanted zone accompanied by a wide distribution of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50d55bbbd2fa3a7187a7f4d6f057612c
https://doi.org/10.1016/s0257-8972(97)00252-1
https://doi.org/10.1016/s0257-8972(97)00252-1
Autor:
S. Prasad Boppana, Theo Z. Kattamis, Kevin Schlichting, Geoff Dearnaley, Deepak G. Bhat, James R. Treglio, Anthony J. Perry, Daniel E. Geist
Publikováno v:
Key Engineering Materials. :177-194
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b915385cf5a59d9a35664bc53f15b7c6
https://doi.org/10.4028/www.scientific.net/kem.138-140.177
https://doi.org/10.4028/www.scientific.net/kem.138-140.177
Publikováno v:
Surface and Coatings Technology. 89:62-69
The X-ray diffraction pattern of κ-Al 2 O 3 in the form of a coating over a Ti(C,N) interlayer has been indexed up to the 204 peak in terms of the hexagonal super-lattice of the orthorhombic unit cell. The lattice parameters have been derived using
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::28f64b1ba373390f91b18a1d2e2b6611
https://doi.org/10.1016/s0257-8972(96)03090-3
https://doi.org/10.1016/s0257-8972(96)03090-3
Publikováno v:
Surface and Coatings Technology. :364-371
The residual stress and strain distribution in each phase of as-ground cemented carbide, before and after metal ion implantation, has been studied using parallel beam glancing angle X-ray diffraction down to a maximum depth of penetration of about 1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::020eb3059c881670b919483921a6e9e1
https://doi.org/10.1016/s0257-8972(96)02975-1
https://doi.org/10.1016/s0257-8972(96)02975-1