Zobrazeno 1 - 10
of 116
pro vyhledávání: '"Daniel D. Frey"'
Publikováno v:
Design Science, Vol 7 (2021)
This paper develops theoretical foundations for extending Gauss–Hermite quadrature to robust design with computer experiments. When the proposed method is applied with m noise variables, the method requires 4m + 1 function evaluations. For situatio
Externí odkaz:
https://doaj.org/article/58b47ccea2fa458184819673d797a07e
Publikováno v:
Dyna, Vol 74, Iss 153, p 0 (2007)
Externí odkaz:
https://doaj.org/article/d209b336830b4981be10b575b479f055
Publikováno v:
Research in Engineering Design. 33:367-384
This research formulates, and numerically quantifies the optimal response that can be discovered in a design space characterized by main effects, and two-way and three-way interactions. In an experimental design setup, this can be conceptualized as t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85da10e5ef2f9e09060fd38fd8c94a65
https://doi.org/10.1007/s00163-022-00390-3
https://doi.org/10.1007/s00163-022-00390-3
Publikováno v:
Springer London
This paper explores the use of designed experiments in an online environment. Motivated by real-world examples, we model a scenario where the practitioner is given a finite set of units and needs to select a subset of these which are expended toward
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a1bd684b6d2751ff0113f822663a0fbf
https://doi.org/10.1007/s00163-019-00311-x
https://doi.org/10.1007/s00163-019-00311-x
Publikováno v:
SAE International Journal of Aerospace. 11:5-26
Geometric variation stemming from manufacturing can be a limiting factor for the quality and reliability of products. Therefore, manufacturing assessments are increasingly being performed during the early stages of product development. In the aerospa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::573560bf6777d664a11eac27cba2a1ff
https://doi.org/10.4271/01-11-01-0001
https://doi.org/10.4271/01-11-01-0001
Publikováno v:
Journal of Mechanical Design. 142
This research studies the use of predetermined experimental plans in a live setting with a finite implementation horizon. In this context, we seek to determine the optimal experimental budget in different environments using a Bayesian framework. We d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bbca494ca39d83df6d66a3995db65237
https://doi.org/10.1115/1.4045603
https://doi.org/10.1115/1.4045603
Publikováno v:
Microelectronics Reliability. 55:1422-1426
Retention is one of the key reliability metrics for non-volatile memory devices. In oxygen ion transport based resistive switching memory (OxRAM), the retention phenomenon has been well studied from an electrical perspective and physical mechanisms e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::59e2940e9d134b47481516f4ccacad10
https://doi.org/10.1016/j.microrel.2015.06.090
https://doi.org/10.1016/j.microrel.2015.06.090
Publikováno v:
Göhler, S M, D. Frey, D & Howard, T J 2017, ' A model-based approach to associate complexity and robustness in engineering systems ', Research in Engineering Design, vol. 28, pp. 223–234 . https://doi.org/10.1007/s00163-016-0236-1
Springer London
Springer London
Ever increasing functionality and complexity of products and systems challenge development companies in achieving high and consistent quality. A model-based approach is used to investigate the relationship between system complexity and system robustn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::409428ba15e2075de9eaecde3478b68b
https://orbit.dtu.dk/en/publications/10258093-d049-40fa-824c-b026e18f3750
https://orbit.dtu.dk/en/publications/10258093-d049-40fa-824c-b026e18f3750
Publikováno v:
Microelectronics Reliability. 54:2266-2271
Forming is one of the key phenomenon that governs the subsequent switchability in high-κ based resistive random access memory (RRAM) devices. The variability of subsequent switching events (voltage and resistance state), shape and size of filament,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0973c252e7b31a563965f346f50c7214
https://doi.org/10.1016/j.microrel.2014.07.118
https://doi.org/10.1016/j.microrel.2014.07.118
Publikováno v:
Microelectronics Reliability. 54:1729-1734
Noise is a key indicator of the physical phenomenon underlying device operation, defect density and degradation trends. The analysis of noise in the frequency domain and the exponent (value of slope, α on logarithmic scale) of the power spectral den
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45e23c48e333f514c83b5b2afbb1213b
https://doi.org/10.1016/j.microrel.2014.07.072
https://doi.org/10.1016/j.microrel.2014.07.072