Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Dani Tannir"'
Autor:
Dani Tannir, Theresa Kahale
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:1191-1195
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2842fd39c18d7d620d28fc7b9fc0d372
https://doi.org/10.1109/tcad.2021.3068098
https://doi.org/10.1109/tcad.2021.3068098
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 9:2451-2464
The polyharmonic distortion parameters of a nonlinear structure or circuit block, often referred to as X-parameters (X-parameters is a registered trademark of Agilent Technologies) relate the different harmonics of the incident waves to those of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b62ced0ba127e31111da1f12da90519
https://doi.org/10.1109/tcpmt.2019.2947588
https://doi.org/10.1109/tcpmt.2019.2947588
Autor:
Farouk Ghizzawi, Dani Tannir
Publikováno v:
2020 IEEE Texas Power and Energy Conference (TPEC).
With the growing demand for electrical DC storage and sources, DC-AC conversion has become an indispensable component for not only high and medium, but also low-power applications. This paper introduces an efficient and accurate multi-harmonic circui
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3205de296f2f7b240a19a3e0343854a5
https://doi.org/10.1109/tpec48276.2020.9042503
https://doi.org/10.1109/tpec48276.2020.9042503
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 8:13-20
Recently X-parameters 1 have been proposed as an extension to the concept of S-parameters in order to create a macromodel that captures nonlinear behavior. In this paper, we develop a relation between the X-parameters and circuit moments. Higher orde
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc99089f4e1827791f332fcd3ce7c870
https://doi.org/10.1109/tcpmt.2017.2749230
https://doi.org/10.1109/tcpmt.2017.2749230
Publikováno v:
2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).
The X-parameters of a nonlinear structure or circuit block relate the different harmonics of the incident power waves to the reflected ones in the frequency domain. Recently, a moments based approach for the computation of the X-parameters sensitivit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b94cf1076f99e6f734fc82cc1366fac
https://doi.org/10.1109/epeps47316.2019.193208
https://doi.org/10.1109/epeps47316.2019.193208
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems. 21:1-15
The development of enhanced modeling techniques for the simulation of switched-mode Pulse Width Modulated (PWM) DC-DC power converters using circuit averaging is the main focus of this article. The circuit-averaging technique has traditionally been u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a8ccaca9d70466bc007b1521021259a9
https://doi.org/10.1145/2890500
https://doi.org/10.1145/2890500
Publikováno v:
2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).
X-parameters11X-parameter is a registered trademark of Agilent Technologies are a useful tool for modeling the nonlinear behaviour of RF circuits and devices. Techniques for their efficient computation as well as measurement have been presented in re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab9452fdec5028677775120bf985c9b5
https://doi.org/10.1109/epeps.2018.8534231
https://doi.org/10.1109/epeps.2018.8534231
Publikováno v:
2018 IEEE/MTT-S International Microwave Symposium - IMS.
Sensitivity analysis is an important part of the design process and facilitates critical steps such as optimization, design centering and yield analysis. X-parameters are a recently proposed modeling and design tool for RF circuits. In this paper we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5617fb182220d71e8daedb5c4b2405fe
https://doi.org/10.1109/mwsym.2018.8439140
https://doi.org/10.1109/mwsym.2018.8439140
Autor:
Dani Tannir
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 34:321-331
Sensitivity analysis is a critically important aspect in the simulation of integrated circuits. It allows the designer to perform vital tasks such as circuit optimization and design space exploration. Recently, an efficient moments-based approach was
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b95dd4a7257db7db4429ed80792d17df
https://doi.org/10.1109/tcad.2014.2384521
https://doi.org/10.1109/tcad.2014.2384521
Autor:
Dani Tannir
Publikováno v:
International Journal of Microwave and Wireless Technologies. 8:193-204
This paper introduces a new technique for the efficient computation of intermodulation distortion in radio frequency circuits that contain microelectromechanical system (MEMS) variable capacitors using moments analysis. This method is applied to an e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86ffd79f50e2ab24f1818ffb2582120d
https://doi.org/10.1017/s1759078714001548
https://doi.org/10.1017/s1759078714001548