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pro vyhledávání: '"Danhua Zeng"'
Publikováno v:
Review of Scientific Instruments. 77:093305
A long trace profiler LTP-1200, with a novel f-θ system based on phase plate diffraction and a scanning range up to 1200mm, has been developed at Shanghai Synchrotron Radiation Facility. The central dark line in the diffraction pattern generated by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::686444a8329b2fda0a60b88eaabe0db6
https://doi.org/10.1063/1.2186253
https://doi.org/10.1063/1.2186253
