Zobrazeno 1 - 10
of 48
pro vyhledávání: '"Danelle M. Tanner"'
Autor:
Danelle M. Tanner
Publikováno v:
Microelectronics Reliability. 49:937-940
This paper reviews the significant successes in MEMS products from a reliability perspective. MEMS reliability is challenging and can be device and process dependent, but exercising the proper reliability techniques very early in product development
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f9467d80fabd3efafc6f1b364edce956
https://doi.org/10.1016/j.microrel.2009.06.014
https://doi.org/10.1016/j.microrel.2009.06.014
Autor:
Alex David Corwin, Steve Winzer, Danelle M. Tanner, Jonathan W. Wittwer, Ted B. Parson, Brad L. Boyce, Jeremy A. Walraven
Publikováno v:
Microelectronics Reliability. 47:1806-1811
In cases where device numbers are limited, large statistical studies to verify reliability are impractical. Instead, an approach incorporating a solid base of modelling, simulation, and material science into a standard reliability methodology makes m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7c4cc1f3a701b755ab703926f5bdf00
https://doi.org/10.1016/j.microrel.2007.07.061
https://doi.org/10.1016/j.microrel.2007.07.061
Autor:
Kenneth A. Peterson, Samuel L. Miller, G La Vigne, P. Clews, Danelle M. Tanner, M. S. Rodgers, Jeffry J. Sniegowski
Publikováno v:
Microelectronics Reliability. 39:1229-1237
In order for the rapidly emerging field of MicroElectroMechanical Systems (MEMS) to meet its extraordinary expectations regarding commercial impact, issues pertaining to how they fail must be understood. We identify and address failure modes common t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46481ff2500c9059de492aca42337eb7
https://doi.org/10.1016/s0026-2714(99)00013-x
https://doi.org/10.1016/s0026-2714(99)00013-x
Autor:
Kenneth A. Peterson, Samuel L. Miller, Lloyd W. Irwin, Danelle M. Tanner, Norman F. Smith, William P. Eaton, Paiboon Tangyunyong, William M. Miller, D.C. Senft, Michael T. Dugger
Publikováno v:
Microelectronics Reliability. 39:401-414
Experiments have been performed on surface micromachined microengines driving load gears to determine the rotational frequency dependence on median cycles to failure. A sample of 272 microengines, each driving a load, was stressed at eight different
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82d146df3ae908ff3dddf1133ab0cabd
https://doi.org/10.1016/s0026-2714(98)00248-0
https://doi.org/10.1016/s0026-2714(98)00248-0
Capacitors used in firing sets and other high discharge current applications are discharge tested to verify performance of the capacitor against the application requirements. Parameters such as capacitance, inductance, rise time, pulse width, peak cu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::511933b4e0d394d220cf2ab7b3b4e87f
https://doi.org/10.2172/1096464
https://doi.org/10.2172/1096464
Autor:
Michael S. Baker, Danelle M. Tanner
This report presents the results of an aging experiment that was established in FY09 and completed in FY10 for the Sandia MEMS Passive Shock Sensor. A total of 37 packages were aged at different temperatures and times, and were then tested after agin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b18563a517c80bf82dedf68c3dd64e7
https://doi.org/10.2172/1008111
https://doi.org/10.2172/1008111
Autor:
Jeremy A. Walraven, Ted B. Parson, Danelle M. Tanner, Roy H. Olsson, Shannon Marie Crouch, James Anthony Ohlhausen
Publikováno v:
SPIE Proceedings.
We report on long-term stability experiments on a novel MEMS radio frequency (RF) resonator fabricated in Aluminum Nitride technology. The AlN fabrication process allows for the realization of resonators, filters, and resonant sensors operating over
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ee66480e3e1877c02c25697c8a17b5d
https://doi.org/10.1117/12.846551
https://doi.org/10.1117/12.846551
Shock testing was performed on a selected commercial-off-the-shelf - MicroElectroMechanical System (COTS-MEMS) accelerometer to determine the margin between the published absolute maximum rating for shock and the 'measured' level where failures are o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a5a244e5bc0bf17c6024fd90f157c620
https://doi.org/10.2172/1028884
https://doi.org/10.2172/1028884
Publikováno v:
SPIE Proceedings.
There is an increasing demand to build highly sensitive, low-G, microscale acceler ation sensors with the ability to sense accelerations in the nano-G (10 -8 m/s 2 ) regime. To achieve such sensitivities, these sensors require compliant mechanical sp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f2cf4bc88c70698f5aaae78d5b0f621
https://doi.org/10.1117/12.778244
https://doi.org/10.1117/12.778244
Autor:
Mark W. Jenkins, Michelle Ann Duesterhaus, James V. Cox, Danelle M. Tanner, Michael T. Dugger, Bernhard Jokiel, Troy J. Skousen, James Anthony Ohlhausen, Shannon J. Timpe, Sam A. Candelaria, Jeremy A. Walraven, Ted B. Parson
Qualification of microsystems for weapon applications is critically dependent on our ability to build confidence in their performance, by predicting the evolution of their behavior over time in the stockpile. The objective of this work was to acceler
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b2dce3c4fcc0d436c43cf75d7346897
https://doi.org/10.2172/923082
https://doi.org/10.2172/923082