Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Dandapani Vijayshankar"'
Autor:
G. Keerthiga, Dandapani Vijayshankar, MJNV Prasad, Mirco Peron, Jafar Albinmousa, RK Singh Raman
Publikováno v:
Metals, Vol 12, Iss 5, p 782 (2022)
The electrochemical corrosion resistance of a Mg-Zn-Zr alloy, ZK60, in different planes with respect to the extrusion direction was investigated in 3.5 wt% NaCl. The motivation of this study lies in the influence of extrusion on the grain size, textu
Externí odkaz:
https://doaj.org/article/22a4571bb46e4bc099f9a481efbc17ec
Publikováno v:
Journal of the Indian Institute of Science. 102:351-389
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9cdbd3a7b2915c8738bb15b0d3cb73a4
https://doi.org/10.1007/s41745-022-00289-x
https://doi.org/10.1007/s41745-022-00289-x
Autor:
Asif Bashir, Dandapani Vijayshankar, Michael Rohwerder, Eberhard Heinen, Abdulrahman Altin, Claudia Merola
Publikováno v:
Journal of The Electrochemical Society. 163:C778-C783
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ae572481561d4393c8d3156d35845f0
https://doi.org/10.1149/2.0971613jes
https://doi.org/10.1149/2.0971613jes
Publikováno v:
Electrochimica Acta. 189:111-117
The electrochemical stability of the buried metal-organic coating interface of painted metal is crucially governed by how effectively the oxygen reduction reaction at the interface is inhibited. As this interface is not directly accessible for study
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::05598f0c62c775464610eb838a5a147c
https://doi.org/10.1016/j.electacta.2015.12.030
https://doi.org/10.1016/j.electacta.2015.12.030
Autor:
Doris Vollmer, Lena Mammen, Dandapani Vijayshankar, Xu Deng, Maria B. Untch, Frédéric Leroy, Rüdiger Berger, Periklis Papadopoulos, Enrico Riccardi
Publikováno v:
Langmuir. 28:15005-15014
The effect of nanoroughness on contact angles and pinning is investigated experimentally and numerically for low-energy surfaces. Nanoroughness is introduced by chemical vapor deposition of tetraethoxysilane and was quantified by scanning force micro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5f732da1a56a9406e0125f7171bc3a70
https://doi.org/10.1021/la302127y
https://doi.org/10.1021/la302127y
Publikováno v:
RSC Advances. 4:12737
Control over the growth of nanoscale roughness on surfaces and interfaces is critical for applications ranging from tunable wettability to anti-reflective coatings. Herein, we investigate the growth of nanoscale roughness on silicon substrates. Nanos
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03e7f47f60a23ff857824a5318463c3a
https://doi.org/10.1039/c3ra46423g
https://doi.org/10.1039/c3ra46423g