Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Dan Shuheng"'
Publikováno v:
Frontiers in Energy Research, Vol 12 (2024)
Introduction: Due to the need for safety and aesthetics, 10 kV urban power grids are gradually dominated by all-cable lines. However, this trend also brings new challenges. Cables, which are equivalent to capacitors at industrial frequency, are prone
Externí odkaz:
https://doaj.org/article/cc83df2f29fd4126a0f9a9cf0ebba82f
Autor:
Dan Shuheng, Benjamin Martin Kundai
Publikováno v:
2022 6th International Conference on Power and Energy Engineering (ICPEE).
Autor:
Jiang Xiuchen, Song Huansheng, Zhao Ziyu, Liu Chongfang, Dan Shuheng, Luo Li-wen, Ma Naixiang
Publikováno v:
2008 23rd International Symposium on Discharges and Electrical Insulation in Vacuum.
The traditional methods for measuring internal pressure P of vacuum tubes of breakers are the magnetron and power frequency voltage withstand test. A magnet coil is needed by magnetron and only very bad tubes can be picked out by voltage withstand te
Publikováno v:
Proceedings ISDEIV. 19th International Symposium on Discharges and Electrical Insulation in Vacuum (Cat. No.00CH37041).
In this paper the chopping current level of several vacuum interrupters which differ from each other by their electrode structure and contact material but share the same outer diameter and the same size of contact are measured comparatively before an
Publikováno v:
2010 Asia-Pacific Power & Energy Engineering Conference (APPEEC); 2010, p1-4, 4p
Publikováno v:
2008 23rd International Symposium on Discharges & Electrical Insulation in Vacuum; 2008, p141-144, 4p
Publikováno v:
2006 International Symposium on Discharges & Electrical Insulation in Vacuum; 2006, p368-371, 4p
Autor:
Dan Shuheng
Publikováno v:
2010 Asia-Pacific Power & Energy Engineering Conference (APPEEC); 2010, p1-3, 3p
Publikováno v:
Electric Power; May2024, Vol. 57 Issue 5, p178-187, 10p
Publikováno v:
Proceedings ISDEIV. 19th International Symposium on Discharges & Electrical Insulation in Vacuum (Cat. No.00CH37041); 2000, p536-536, 1p