Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Dan J. Bodoh"'
Autor:
Jim Vickers, Dan J. Bodoh, Ed Black, Kris Dickson, Dan Cotton, Birk Lee, Ron Wang, Nader Pakdaman, Tim Cheng
Publikováno v:
International Symposium for Testing and Failure Analysis.
Time-resolved photon emission has been shown to be useful in analyzing clock skews and timing-related defects in flip-chip devices. In practice, time-resolved photon emission using the S-25 Quantar detector cannot be used at long loop lengths (typica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6dabd00b4f51d5022d8114f49310f490
https://doi.org/10.31399/asm.cp.istfa2002p0655
https://doi.org/10.31399/asm.cp.istfa2002p0655
Autor:
Dan J. Bodoh
Publikováno v:
International Symposium for Testing and Failure Analysis.
To isolate defects in microprocessors, the failure analyst must exercise the device under the failing conditions. Exercising the device with a tester and the final test program is a natural choice. However, populating a lab with production testers ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f357136bc2841bd5e409574a89c1a4e5
https://doi.org/10.31399/asm.cp.istfa1999p0197
https://doi.org/10.31399/asm.cp.istfa1999p0197
Autor:
Dan J. Bodoh
Publikováno v:
International Symposium for Testing and Failure Analysis.
The growth of the Internet over the past four years provides the failure analyst with a new media for communicating his results. The new digital media offers significant advantages over analog publication of results. Digital production, distribution
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c680fdd5b58345840aa4293ba4e87bcf
https://doi.org/10.31399/asm.cp.istfa1998p0323
https://doi.org/10.31399/asm.cp.istfa1998p0323