Zobrazeno 1 - 10
of 160
pro vyhledávání: '"Dan Herr"'
Publikováno v:
APL Materials, Vol 1, Iss 4, Pp 040701-040701 (2013)
Recent discussions concerning the continuation of Moore's law have focused on announcements by several major corporations to transition from traditional 2D planar to new 3D multi-gate field effect transistor devices. However, the growth and progressi
Externí odkaz:
https://doaj.org/article/db5470e2dd0044c7be42e943d66ed964
Autor:
Robert M, Kotloff, Sandralee, Blosser, Gerard J, Fulda, Darren, Malinoski, Vivek N, Ahya, Luis, Angel, Matthew C, Byrnes, Michael A, DeVita, Thomas E, Grissom, Scott D, Halpern, Thomas A, Nakagawa, Peter G, Stock, Debra L, Sudan, Kenneth E, Wood, Sergio J, Anillo, Thomas P, Bleck, Elling E, Eidbo, Richard A, Fowler, Alexandra K, Glazier, Cynthia, Gries, Richard, Hasz, Dan, Herr, Akhtar, Khan, David, Landsberg, Daniel J, Lebovitz, Deborah Jo, Levine, Mudit, Mathur, Priyumvada, Naik, Claus U, Niemann, David R, Nunley, Kevin J, O'Connor, Shawn J, Pelletier, Omar, Rahman, Dinesh, Ranjan, Ali, Salim, Robert G, Sawyer, Teresa, Shafer, David, Sonneti, Peter, Spiro, Maryam, Valapour, Deepak, Vikraman-Sushama, Timothy P M, Whelan, Kevin, O'Connor
Publikováno v:
Critical care medicine. 43(6)
This document was developed through the collaborative efforts of the Society of Critical Care Medicine, the American College of Chest Physicians, and the Association of Organ Procurement Organizations. Under the auspices of these societies, a multidi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7fc29ff2c81d2df62e184ad942a0636e
https://pubmed.ncbi.nlm.nih.gov/26468715
https://pubmed.ncbi.nlm.nih.gov/26468715
Autor:
Amal Chabli, Peter Cherns, Nicolas Chevalier, David Cooper, Dominique Lafond, François Bertin, Henri Blanc, Ariel Brenac, Philippe Andreucci, Jean-Christophe Gabriel, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, Alain C. Diebold
Publikováno v:
Frontiers of Characterization and Metrology for Nanoelectronics. AIP, 2009
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, May 2009, Albany, New York, United States. pp.12-20, ⟨10.1063/1.3251207⟩
ResearcherID
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, May 2009, Albany, New York, United States. pp.12-20, ⟨10.1063/1.3251207⟩
ResearcherID
International audience; Depending on the level of the technological developments, the characterization techniques are mature tosupport them or still require protocol definition and relevance demonstration for the issues addressed. For BeyondCMOS and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::56834d9add8aebf5479754f426c6258f
https://hal-cea.archives-ouvertes.fr/cea-01549318/file/47-Chabli_caract-3d_Chabli_et_al.pdf
https://hal-cea.archives-ouvertes.fr/cea-01549318/file/47-Chabli_caract-3d_Chabli_et_al.pdf
Autor:
Erik M. Secula, Dan Herr, C. Michael Garner, Alain C. Diebold, Robert McDonald, David G. Seiler, Rajinder P. Khosla
Publikováno v:
AIP Conference Proceedings.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a2582b09e51022b2bc3461b4e77bb20
https://doi.org/10.1063/v1173.backmatter
https://doi.org/10.1063/v1173.backmatter
Autor:
Joseph J. Kopanski, Paul McClure, Vladimir Mancevski, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, Alain C. Diebold
Publikováno v:
AIP Conference Proceedings.
The response of a scanning Kelvin force microscope (SKFM) was measured with conventional micromachined silicon tips coated with Au and with advanced tips terminated with a carbon nanotube (CNT). A simple model of the SKFM predicts enhanced spatial re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a783d56151ef5b9843c599d06bf572f
https://doi.org/10.1063/1.3251223
https://doi.org/10.1063/1.3251223
Autor:
Lay Wai Kong, A. C. Diebold, A. Rudack, S. Arkalgud, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, Alain C. Diebold
Publikováno v:
AIP Conference Proceedings.
The College of Nanoscale Science and Engineering of the University at Albany in collaboration with International SEMATECH is investigating the use of Scanning Acoustic Microscope (SAM) for analyzing 3D Interconnects. SAM is a non‐destructive metrol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a5a7be852343ffc3f71ee59bdb0af1e
https://doi.org/10.1063/1.3251213
https://doi.org/10.1063/1.3251213
Autor:
V. K. Kamineni, M. Raymond, E. J. Bersch, B. B. Doris, A. C. Diebold, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, Alain C. Diebold
Publikováno v:
AIP Conference Proceedings.
Spectroscopic ellipsometry (SE) and resistivity measurements were used to characterize Nickel‐metal films used for self‐aligned silicidation process. Variable angle spectroscopic ellipsometer (VASE) in the VUV range of wavelengths was used to mea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ee1bdab2b0f55fac3737d4055b32974
https://doi.org/10.1063/1.3251204
https://doi.org/10.1063/1.3251204
Autor:
Nicolas Pic, Gennadi Polisski, Emmanuel Paire, Véronique Rizzo, Catherine Grosjean, Benjamin Bortolotti, John D’Amico, Nicolas Cabuil, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, Alain C. Diebold
Publikováno v:
AIP Conference Proceedings.
The continuous race to reduce the dimensions of IC components has lead to the introduction of Nitrogen in the thin gate oxide layer in order to increase the dielectric constant and to improve the gate dielectric properties. It is mandatory to apply i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73173d355b24f72dc9de982f60cb59c0
https://doi.org/10.1063/1.3251245
https://doi.org/10.1063/1.3251245
Autor:
Peter Moeck, Sergei Rouvimov, Edgar F. Rauch, Stavros Nicolopoulos, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, Alain C. Diebold
Publikováno v:
AIP Conference Proceedings.
An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is described. It is based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eee78a2aa369fe859b8e618bcf5cc11c
https://doi.org/10.1063/1.3251240
https://doi.org/10.1063/1.3251240
Autor:
B. Beckhoff, P. Hoenicke, D. Giubertoni, G. Pepponi, M. Bersani, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, Alain C. Diebold
Publikováno v:
AIP Conference Proceedings.
Grazing Incidence X‐Ray Fluorescence (GIXRF) analysis in the soft X‐ray range provides excellent conditions for exciting B‐K and As‐Liii,ii shells. The X‐ray Standing Wave field (XSW) associated with GIXRF on flat samples is used as a tunab
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::057a7fdda56e2a65debbe454e6315ac1
https://doi.org/10.1063/1.3251239
https://doi.org/10.1063/1.3251239