Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Dan Butnicu"'
Autor:
Dan Butnicu
Publikováno v:
Energies, Vol 17, Iss 16, p 3957 (2024)
In the last decade, a higher level of reliability has become a compulsory demand when it comes to modern DC-DC converters. This work addresses the main reliability metrics: in many studies, the failure rate λ and MTBF of an output capacitor bank use
Externí odkaz:
https://doaj.org/article/5ea2ef87e54841ec988e5bee1feec460
Publikováno v:
Polymers, Vol 16, Iss 3, p 368 (2024)
Simulation techniques implemented with the HFSS program were used for structure optimization from the point of view of increasing the conductivity of the batteries’ electrolytes. Our analysis was focused on reliable “beyond lithium-ion” batteri
Externí odkaz:
https://doaj.org/article/d5f27dd6296d4030bd32b07ea9e8053f
Autor:
Dan Butnicu, Alexandru Lazar
Publikováno v:
Energies, Vol 16, Iss 6, p 2768 (2023)
The last decade’s studies show that the PoL (point-of-load) converter’s output capacitor is an important component for reliability, implying that its careful selection may determine the overall converter’s failure rate and lifetime. PoL convert
Externí odkaz:
https://doaj.org/article/4c636d9c8d314c47a2cfaea91bf47a09
Autor:
Dan Butnicu
Publikováno v:
Micromachines, Vol 14, Iss 1, p 221 (2023)
Many recent studies have revealed that PoL (Point of Load) converters’ output capacitors are a paramount component from a reliability point of view. To receive the maximum degree of reliability in many applications, designers are often advised to d
Externí odkaz:
https://doaj.org/article/11acbaee8e2e49d4a3d8fa8eef0ee1c8
Autor:
Dan Butnicu
Publikováno v:
2022 IEEE 28th International Symposium for Design and Technology in Electronic Packaging (SIITME).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::23391cf7b0afe605d69a89b005c36bc8
https://doi.org/10.1109/siitme56728.2022.9987935
https://doi.org/10.1109/siitme56728.2022.9987935
Autor:
Dan Butnicu, Radu Tristu
Publikováno v:
2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a47d5ac6e981e95df9a964e2d21a0be
https://doi.org/10.1109/estc55720.2022.9939540
https://doi.org/10.1109/estc55720.2022.9939540
Autor:
Dan Butnicu
Publikováno v:
2021 IEEE 27th International Symposium for Design and Technology in Electronic Packaging (SIITME).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::186af68642954eca9498b72365621944
https://doi.org/10.1109/siitme53254.2021.9663584
https://doi.org/10.1109/siitme53254.2021.9663584
Autor:
Dan Butnicu
Publikováno v:
2021 IEEE 27th International Symposium for Design and Technology in Electronic Packaging (SIITME).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6c70b80175bbaca20cd1db80d58c58c
https://doi.org/10.1109/siitme53254.2021.9663431
https://doi.org/10.1109/siitme53254.2021.9663431
Autor:
Dan Butnicu, Dorin O. Neacsu
Publikováno v:
Electric Power Components and Systems. 47:444-455
This paper analyzes the reliability calculation method and elaborates on lifetime implications for an external computer power supply unit. Calculation is performed following MIL-HDBK-217 specificat...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c9ae0e68cc4d7b0f2bb879dc2948c09
https://doi.org/10.1080/15325008.2019.1606124
https://doi.org/10.1080/15325008.2019.1606124
This article is concerned with reliability analysis in relation to optimal switching of resonant power converters, aimed at minimizing their power loss and operational temperature and, thus, reducing their lifetime degradation. In most cases, high-pe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2daa2bce109d8d2ef6c0eaefa543b3a6
https://arro.anglia.ac.uk/id/eprint/706143/6/Neacsu_et_al_2020.pdf
https://arro.anglia.ac.uk/id/eprint/706143/6/Neacsu_et_al_2020.pdf
