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pro vyhledávání: '"Damien Richert"'
Autor:
Damien Richert, José Morán-Meza, Khaled Kaja, Alexandra Delvallée, Djamel Allal, Brice Gautier, François Piquemal
Publikováno v:
Nanomaterials, Vol 11, Iss 11, p 3104 (2021)
The importance of high dielectric constant materials in the development of high frequency nano-electronic devices is undeniable. Their polarization properties are directly dependent on the value of their relative permittivity. We report here on the n
Externí odkaz:
https://doaj.org/article/ba57fd9643974cc3b3795bd8018b788a
Publikováno v:
Nanomaterials, Vol 11, Iss 3, p 820 (2021)
Reference samples are commonly used for the calibration and quantification of nanoscale electrical measurements of capacitances and dielectric constants in scanning microwave microscopy (SMM) and similar techniques. However, the traceability of these
Externí odkaz:
https://doaj.org/article/c781d7b0fd9b4962ba5d8a3e824eed17