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pro vyhledávání: '"Damien Francis Reardon"'
Autor:
Zhigang Li, James F. Ryley, Lijie Bao, Charles Wilker, Lei Zhang, Robert L. Opila, Damien Francis Reardon
Publikováno v:
Journal of Applied Physics. 106:114114
BaTiO3 (BTO) thin film capacitors were deposited on Ni substrate using rf magnetron sputtering. Microstructural studies by x-ray diffraction and transmission electron microscopy reveal that the as-grown BTO films have the columnar structure and the g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08ac465088e39873e830aa20ddfcac73
https://doi.org/10.1063/1.3254194
https://doi.org/10.1063/1.3254194
