Characterization of MOS varactor with large signal Network Analyser (LSNA) in CMOS 65nm bulk and SOI technologies

Autor: Christophe Gaquiere, Damien Ducateau, J.-F. Larchanche, Yvan Morandini, Daniel Gloria

Publikováno v: Proceedings of the 69th ARFTG Microwave Measurement Conference
Proceedings of the 69th ARFTG Microwave Measurement Conference, 2007, Honolulu, HI, United States

Here we report for the first time the non linear characterization and modeling of MOS varactor with a LSNA in bulk and SOI process. The comparison between large signal measurements and Harmonic Balance simulation using an electrical equivalent scheme

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::84bca994b0c3aa1fa6532212c5996975
https://doi.org/10.1109/arftg.2007.5456328