Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Dale Meehl"'
Autor:
Brian Edward Foutz, Vivek Chickermane, Louis Christopher Milano, Christos Papameletis, Dale Meehl, Paul Alexander Cunningham, David George Scott, Krishna Chakravadhanula, Steev Wilcox
Publikováno v:
ITC
Test Compression ratios are currently stalled at 100–200X. A new 2-dimensional physically-aware sequential Compressor-Decompressor design addresses the severe wiring congestion as well as the test coverage droop and pattern spike at the highest com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b824adf813c579cf4e81c9126974226
https://doi.org/10.1109/test.2017.8242035
https://doi.org/10.1109/test.2017.8242035
Publikováno v:
Asian Test Symposium
With a large focus on test data size and fitting into tester's capabilities, sometimes the focus of field testing is pushed to the side. There is an emerging market in automotive design where greater emphasis is being placed on the need for field tes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::549e513e94e79860654d654a344e7820
https://doi.org/10.1109/ats.2012.24
https://doi.org/10.1109/ats.2012.24
Publikováno v:
Asian Test Symposium
This paper shows a way to define a partially-exhaustive gate transition fault model for use in catching defects that escape when using more traditional fault models. We define the gate-level transitions ATPG must create for this fault model and how t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1387b2d697bb864ea0169d86e3f67813
https://doi.org/10.1109/ats.2009.62
https://doi.org/10.1109/ats.2009.62
Publikováno v:
ITC
Multi-capture-clock scan patterns for the traditional stuck-at-fault model have been used to reduce down pattern counts while still maintaining high test coverage. This paper studies how the same test patterns provide a decent N-detect fault coverage
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9af79ec99615d1e8d3a72e588c6d8c5d
https://doi.org/10.1109/test.2007.4437648
https://doi.org/10.1109/test.2007.4437648
Autor:
Sanae Seike, Ken Namura, Yukio Ohya, Anis Uzzaman, Shinichi Arima, Dale Meehl, Vivek Chickermane, Azumi Kobayashi, Satoshi Tanaka, Hiroyuki Adachi
Publikováno v:
2006 15th Asian Test Symposium.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a85c10fb5d229f3d396179b474d97c4
https://doi.org/10.1109/ats.2006.260964
https://doi.org/10.1109/ats.2006.260964